Noncontact measurement of complex permittivity and thickness by using planar resonators

Chin Lung Yang, Chieh Sen Lee, Kuan Wei Chen, Kuan Zhou Chen

Research output: Contribution to journalArticlepeer-review

172 Citations (Scopus)


This paper presents a novel noncontact measurement technique that entails using a single-compound triple complementary split-ring resonator (SC-TCSRR) to determine the complex permittivity and thickness of a material under test (MUT). The proposed technique overcomes the problem engendered by the existence of air gaps between the sensor ground plane and the MUT. In the proposed approach, a derived governing equation of the resonance frequencies is used to estimate the thickness and complex permittivity of the MUT by calculating the resonant frequency (fr) and magnitude response in a single-step noncontact measurement process. This study theoretically analyzed and experimentally verified a simple and low-cost SC-TCSRR measurement method for assessing materials in a noncontact method. For a 0.2-mm air gap, the experiments yielded average measurement errors of 4.32% and 5.05% for the thickness and permittivity, respectively. The proposed SC-TCSRR technique provides excellent solutions for reducing the effect of air-gap conditions on permittivity, thickness, and loss tangent in noncontact measurements.

Original languageEnglish
Article number7358167
Pages (from-to)247-257
Number of pages11
JournalIEEE Transactions on Microwave Theory and Techniques
Issue number1
Publication statusPublished - 2016 Jan 1

All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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