Normal incidence detector using Ge quantum well structures grown on Si (100)

Chanho Lee, S. K. Chun, K. L. Wang

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Article number1009622
JournalDevice Research Conference - Conference Digest, DRC
VolumePart F146191
DOIs
Publication statusPublished - 1993
Event51st Annual Device Research Conference, DRC 1993 - Santa Barbara, United States
Duration: 1993 Jun 211993 Jun 23

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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