Abstract
We present a novel measurement method to measure the echo rating baseband parameter at the subscriber. A relation between the echo rating and the in-channel frequency response is found from both theoretical derivations and experimental results. We use the inchannel frequency response rf parameter to simultaneously indicate the echo rating performance. This proposed novel echo rating measurement method is simpler and more cost-effective than the conventional measurement method.
| Original language | English |
|---|---|
| Pages (from-to) | 2677-2680 |
| Number of pages | 4 |
| Journal | Optical Engineering |
| Volume | 39 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 2000 Oct 1 |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- General Engineering