Original language | English |
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Title of host publication | The 11th International Thin Film Transistor Conference |
Place of Publication | Rennes, France |
Publication status | Published - 2015 Feb 27 |
Novel Reliability Mechanism of Quasi Reaction-Diffusion Model for PBTI in n-channel HfO2 LTPS-TFTs with Dual Plasma Treatment
Chien Hung Wu, Bo Wen Huang, Kow Ming Chang, Ting Chia Chang, Lin Sheng-Chia , Jian Hong Lin, Shui-Jinn Wang
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution