Numerical simulation for the ionization energy loss in water

Yu Lin Lin, Wei Da Wu, Ming Chieh Lin, Chi-Chuan Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

On the physical aspects of Heavy Ion Tumor Therapy (HITT), accurate determination of specific energy loss (SEL) or stopping power is very important to the improvement of modeling the relative biological effectiveness and developing powerful computer algorithms for treatment planning. In this work, the relativistic version of the Bethe-Bloch formula is revisited and SEL of heavy ions in water is calculated. The SEL for a fast charged particle moving through water is calculated by numerical method. The Bragg curve to the stopping power for various charged particles has been evaluated by first-order approximation and Runge-kutta method. Numerical simulations have been employed to predict the total stopping power and compared with those calculated using The Stopping and Range of Ions in Matter (SRIM) code. Detailed analysis and simulation results will be presented and discussed.

Original languageEnglish
Title of host publicationIVNC 2015 - Technical Digest
Subtitle of host publication28th International Vacuum Nanoelectronics Conference
EditorsQionghui Zou, Juncong She, Peng Ye, Jun Chen, Shaozhi Deng
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages60-61
Number of pages2
ISBN (Electronic)9781467393577
DOIs
Publication statusPublished - 2015 Aug 26
Event28th International Vacuum Nanoelectronics Conference, IVNC 2015 - Guangzhou, China
Duration: 2015 Jul 132015 Jul 17

Publication series

NameIVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference

Other

Other28th International Vacuum Nanoelectronics Conference, IVNC 2015
CountryChina
CityGuangzhou
Period15-07-1315-07-17

Fingerprint

Ionization potential
Energy dissipation
Charged particles
Heavy ions
Computer simulation
Water
Runge Kutta methods
Tumors
Numerical methods
Planning
Ions

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Lin, Y. L., Wu, W. D., Lin, M. C., & Hwang, C-C. (2015). Numerical simulation for the ionization energy loss in water. In Q. Zou, J. She, P. Ye, J. Chen, & S. Deng (Eds.), IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference (pp. 60-61). [7225532] (IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVNC.2015.7225532
Lin, Yu Lin ; Wu, Wei Da ; Lin, Ming Chieh ; Hwang, Chi-Chuan. / Numerical simulation for the ionization energy loss in water. IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference. editor / Qionghui Zou ; Juncong She ; Peng Ye ; Jun Chen ; Shaozhi Deng. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 60-61 (IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference).
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abstract = "On the physical aspects of Heavy Ion Tumor Therapy (HITT), accurate determination of specific energy loss (SEL) or stopping power is very important to the improvement of modeling the relative biological effectiveness and developing powerful computer algorithms for treatment planning. In this work, the relativistic version of the Bethe-Bloch formula is revisited and SEL of heavy ions in water is calculated. The SEL for a fast charged particle moving through water is calculated by numerical method. The Bragg curve to the stopping power for various charged particles has been evaluated by first-order approximation and Runge-kutta method. Numerical simulations have been employed to predict the total stopping power and compared with those calculated using The Stopping and Range of Ions in Matter (SRIM) code. Detailed analysis and simulation results will be presented and discussed.",
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Lin, YL, Wu, WD, Lin, MC & Hwang, C-C 2015, Numerical simulation for the ionization energy loss in water. in Q Zou, J She, P Ye, J Chen & S Deng (eds), IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference., 7225532, IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference, Institute of Electrical and Electronics Engineers Inc., pp. 60-61, 28th International Vacuum Nanoelectronics Conference, IVNC 2015, Guangzhou, China, 15-07-13. https://doi.org/10.1109/IVNC.2015.7225532

Numerical simulation for the ionization energy loss in water. / Lin, Yu Lin; Wu, Wei Da; Lin, Ming Chieh; Hwang, Chi-Chuan.

IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference. ed. / Qionghui Zou; Juncong She; Peng Ye; Jun Chen; Shaozhi Deng. Institute of Electrical and Electronics Engineers Inc., 2015. p. 60-61 7225532 (IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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N2 - On the physical aspects of Heavy Ion Tumor Therapy (HITT), accurate determination of specific energy loss (SEL) or stopping power is very important to the improvement of modeling the relative biological effectiveness and developing powerful computer algorithms for treatment planning. In this work, the relativistic version of the Bethe-Bloch formula is revisited and SEL of heavy ions in water is calculated. The SEL for a fast charged particle moving through water is calculated by numerical method. The Bragg curve to the stopping power for various charged particles has been evaluated by first-order approximation and Runge-kutta method. Numerical simulations have been employed to predict the total stopping power and compared with those calculated using The Stopping and Range of Ions in Matter (SRIM) code. Detailed analysis and simulation results will be presented and discussed.

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Lin YL, Wu WD, Lin MC, Hwang C-C. Numerical simulation for the ionization energy loss in water. In Zou Q, She J, Ye P, Chen J, Deng S, editors, IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference. Institute of Electrical and Electronics Engineers Inc. 2015. p. 60-61. 7225532. (IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference). https://doi.org/10.1109/IVNC.2015.7225532