On detecting single and multiple bridging faults in CMOS circuits using the current supply monitoring method

Kuen Jong Lee, Melvin A. Breuer

Research output: Contribution to journalConference article

8 Citations (Scopus)

Abstract

Several examples are presented to illustrate the limitations of current supply monitoring (CSM). Constraints on a circuit and its test environment which guide the use of CSM are described. Under these constraints it is formally shown that all single irredundant bridging faults can be detected by single vector tests and that a test vector which detects a single bridging fault f1 also detects all multiple bridging faults that contain f1.

Original languageEnglish
Pages (from-to)5-8
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
Volume1
Publication statusPublished - 1990 Dec 1
Event1990 IEEE International Symposium on Circuits and Systems Part 4 (of 4) - New Orleans, LA, USA
Duration: 1990 May 11990 May 3

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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