Abstract
Measurement systems analysis (MSA) ensures that the required data can reliably perform quality improvement initiatives. The common program to assess the precision of a measurement system is the gauge repeatability and reproducibility(R&R) study. Few investigations relate to the gauge R&R study for attribute data despite a need for industrial applications. Industries with near zero-defect manufacturing environments often experience occasional nonconformities in some samples when random shocks arise. The standard MSA may fail to identify defective data from high-quality processes. This study proposes an attribute gauge system to enhance the capability of the measurement system. The process and potential of the proposed system is illustrated using a manufacturing case.
| Original language | English |
|---|---|
| Title of host publication | 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008 |
| Pages | 2046-2050 |
| Number of pages | 5 |
| DOIs | |
| Publication status | Published - 2008 Dec 1 |
| Event | 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008 - Singapore, Singapore Duration: 2008 Dec 8 → 2008 Dec 11 |
Publication series
| Name | 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008 |
|---|
Other
| Other | 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008 |
|---|---|
| Country | Singapore |
| City | Singapore |
| Period | 08-12-08 → 08-12-11 |
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All Science Journal Classification (ASJC) codes
- Management Information Systems
- Industrial and Manufacturing Engineering
Cite this
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On evaluating the measurement capability of high-quality processes. / Lyu, Jrjung; Chen, M. N.
2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008. 2008. p. 2046-2050 4738231 (2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - On evaluating the measurement capability of high-quality processes
AU - Lyu, Jrjung
AU - Chen, M. N.
PY - 2008/12/1
Y1 - 2008/12/1
N2 - Measurement systems analysis (MSA) ensures that the required data can reliably perform quality improvement initiatives. The common program to assess the precision of a measurement system is the gauge repeatability and reproducibility(R&R) study. Few investigations relate to the gauge R&R study for attribute data despite a need for industrial applications. Industries with near zero-defect manufacturing environments often experience occasional nonconformities in some samples when random shocks arise. The standard MSA may fail to identify defective data from high-quality processes. This study proposes an attribute gauge system to enhance the capability of the measurement system. The process and potential of the proposed system is illustrated using a manufacturing case.
AB - Measurement systems analysis (MSA) ensures that the required data can reliably perform quality improvement initiatives. The common program to assess the precision of a measurement system is the gauge repeatability and reproducibility(R&R) study. Few investigations relate to the gauge R&R study for attribute data despite a need for industrial applications. Industries with near zero-defect manufacturing environments often experience occasional nonconformities in some samples when random shocks arise. The standard MSA may fail to identify defective data from high-quality processes. This study proposes an attribute gauge system to enhance the capability of the measurement system. The process and potential of the proposed system is illustrated using a manufacturing case.
UR - http://www.scopus.com/inward/record.url?scp=62749201529&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=62749201529&partnerID=8YFLogxK
U2 - 10.1109/IEEM.2008.4738231
DO - 10.1109/IEEM.2008.4738231
M3 - Conference contribution
SN - 9781424426300
T3 - 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008
SP - 2046
EP - 2050
BT - 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008
ER -