On evaluating the measurement capability of high-quality processes

J. J. Lyu, M. N. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Measurement systems analysis (MSA) ensures that the required data can reliably perform quality improvement initiatives. The common program to assess the precision of a measurement system is the gauge repeatability and reproducibility(R&R) study. Few investigations relate to the gauge R&R study for attribute data despite a need for industrial applications. Industries with near zero-defect manufacturing environments often experience occasional nonconformities in some samples when random shocks arise. The standard MSA may fail to identify defective data from high-quality processes. This study proposes an attribute gauge system to enhance the capability of the measurement system. The process and potential of the proposed system is illustrated using a manufacturing case.

Original languageEnglish
Title of host publication2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008
Pages2046-2050
Number of pages5
DOIs
Publication statusPublished - 2008 Dec 1
Event2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008 - Singapore, Singapore
Duration: 2008 Dec 82008 Dec 11

Publication series

Name2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008

Other

Other2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008
CountrySingapore
CitySingapore
Period08-12-0808-12-11

Fingerprint

Gages
Systems analysis
Industrial applications
Defects
Process quality
Measurement system
Industry
Manufacturing
Quality improvement

All Science Journal Classification (ASJC) codes

  • Management Information Systems
  • Industrial and Manufacturing Engineering

Cite this

Lyu, J. J., & Chen, M. N. (2008). On evaluating the measurement capability of high-quality processes. In 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008 (pp. 2046-2050). [4738231] (2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008). https://doi.org/10.1109/IEEM.2008.4738231
Lyu, J. J. ; Chen, M. N. / On evaluating the measurement capability of high-quality processes. 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008. 2008. pp. 2046-2050 (2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008).
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Lyu, JJ & Chen, MN 2008, On evaluating the measurement capability of high-quality processes. in 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008., 4738231, 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008, pp. 2046-2050, 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008, Singapore, Singapore, 08-12-08. https://doi.org/10.1109/IEEM.2008.4738231

On evaluating the measurement capability of high-quality processes. / Lyu, J. J.; Chen, M. N.

2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008. 2008. p. 2046-2050 4738231 (2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Lyu JJ, Chen MN. On evaluating the measurement capability of high-quality processes. In 2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008. 2008. p. 2046-2050. 4738231. (2008 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2008). https://doi.org/10.1109/IEEM.2008.4738231