Abstract
Embedded flash memory has been widely used in applications that require non-volatile on-chip storage elements. However, test and diagnostics of flash memories needs further investigation so that the overall cost of the products can be reduced. This paper presents the challenges and issues for test and diagnostics of flash memories, based on our recent experiences. We also suggest improvement of the test and diagnosis flow, including design-for-testability (DFT) using built-in self-test (BIST), built-in self-repair (BISR), and failure analysis. In addition, we present a configurable flash memory tester using FPGA for low-cost testing and diagnostics. Experimental results on industrial flash chips justify the effectiveness of our test and diagnostics system.
| Original language | English |
|---|---|
| Pages (from-to) | 260-265 |
| Number of pages | 6 |
| Journal | Proceedings of the Asian Test Symposium |
| Publication status | Published - 2004 Dec 1 |
| Event | Proceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan Duration: 2004 Nov 15 → 2004 Nov 17 |
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All Science Journal Classification (ASJC) codes
- Media Technology
- Hardware and Architecture
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On test and diagnostics of flash memories. / Huang, Chih Tsun; Yeh, Jen Chieh; Shih, Yuan Yuan; Huang, Rei Fu; Wu, Cheng Wen.
In: Proceedings of the Asian Test Symposium, 01.12.2004, p. 260-265.Research output: Contribution to journal › Conference article
TY - JOUR
T1 - On test and diagnostics of flash memories
AU - Huang, Chih Tsun
AU - Yeh, Jen Chieh
AU - Shih, Yuan Yuan
AU - Huang, Rei Fu
AU - Wu, Cheng Wen
PY - 2004/12/1
Y1 - 2004/12/1
N2 - Embedded flash memory has been widely used in applications that require non-volatile on-chip storage elements. However, test and diagnostics of flash memories needs further investigation so that the overall cost of the products can be reduced. This paper presents the challenges and issues for test and diagnostics of flash memories, based on our recent experiences. We also suggest improvement of the test and diagnosis flow, including design-for-testability (DFT) using built-in self-test (BIST), built-in self-repair (BISR), and failure analysis. In addition, we present a configurable flash memory tester using FPGA for low-cost testing and diagnostics. Experimental results on industrial flash chips justify the effectiveness of our test and diagnostics system.
AB - Embedded flash memory has been widely used in applications that require non-volatile on-chip storage elements. However, test and diagnostics of flash memories needs further investigation so that the overall cost of the products can be reduced. This paper presents the challenges and issues for test and diagnostics of flash memories, based on our recent experiences. We also suggest improvement of the test and diagnosis flow, including design-for-testability (DFT) using built-in self-test (BIST), built-in self-repair (BISR), and failure analysis. In addition, we present a configurable flash memory tester using FPGA for low-cost testing and diagnostics. Experimental results on industrial flash chips justify the effectiveness of our test and diagnostics system.
UR - http://www.scopus.com/inward/record.url?scp=13244277458&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=13244277458&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:13244277458
SP - 260
EP - 265
JO - Proceedings of the Asian Test Symposium
JF - Proceedings of the Asian Test Symposium
SN - 1081-7735
ER -