On test and diagnostics of flash memories

Chih Tsun Huang, Jen Chieh Yeh, Yuan Yuan Shih, Rei Fu Huang, Cheng Wen Wu

Research output: Contribution to journalConference article

4 Citations (Scopus)

Abstract

Embedded flash memory has been widely used in applications that require non-volatile on-chip storage elements. However, test and diagnostics of flash memories needs further investigation so that the overall cost of the products can be reduced. This paper presents the challenges and issues for test and diagnostics of flash memories, based on our recent experiences. We also suggest improvement of the test and diagnosis flow, including design-for-testability (DFT) using built-in self-test (BIST), built-in self-repair (BISR), and failure analysis. In addition, we present a configurable flash memory tester using FPGA for low-cost testing and diagnostics. Experimental results on industrial flash chips justify the effectiveness of our test and diagnostics system.

Original languageEnglish
Pages (from-to)260-265
Number of pages6
JournalProceedings of the Asian Test Symposium
Publication statusPublished - 2004 Dec 1
EventProceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan
Duration: 2004 Nov 152004 Nov 17

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Flash memory
Design for testability
Built-in self test
Failure analysis
Field programmable gate arrays (FPGA)
Costs
Repair
Testing

All Science Journal Classification (ASJC) codes

  • Media Technology
  • Hardware and Architecture

Cite this

Huang, C. T., Yeh, J. C., Shih, Y. Y., Huang, R. F., & Wu, C. W. (2004). On test and diagnostics of flash memories. Proceedings of the Asian Test Symposium, 260-265.
Huang, Chih Tsun ; Yeh, Jen Chieh ; Shih, Yuan Yuan ; Huang, Rei Fu ; Wu, Cheng Wen. / On test and diagnostics of flash memories. In: Proceedings of the Asian Test Symposium. 2004 ; pp. 260-265.
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Huang, CT, Yeh, JC, Shih, YY, Huang, RF & Wu, CW 2004, 'On test and diagnostics of flash memories', Proceedings of the Asian Test Symposium, pp. 260-265.

On test and diagnostics of flash memories. / Huang, Chih Tsun; Yeh, Jen Chieh; Shih, Yuan Yuan; Huang, Rei Fu; Wu, Cheng Wen.

In: Proceedings of the Asian Test Symposium, 01.12.2004, p. 260-265.

Research output: Contribution to journalConference article

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AB - Embedded flash memory has been widely used in applications that require non-volatile on-chip storage elements. However, test and diagnostics of flash memories needs further investigation so that the overall cost of the products can be reduced. This paper presents the challenges and issues for test and diagnostics of flash memories, based on our recent experiences. We also suggest improvement of the test and diagnosis flow, including design-for-testability (DFT) using built-in self-test (BIST), built-in self-repair (BISR), and failure analysis. In addition, we present a configurable flash memory tester using FPGA for low-cost testing and diagnostics. Experimental results on industrial flash chips justify the effectiveness of our test and diagnostics system.

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Huang CT, Yeh JC, Shih YY, Huang RF, Wu CW. On test and diagnostics of flash memories. Proceedings of the Asian Test Symposium. 2004 Dec 1;260-265.