On the charge sharing problem in CMOS stuck-open fault testing

Kuen-Jong Lee, Melvin A. Breuer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)

Abstract

The charge-sharing problem associated with the detection of CMOS stuck-open faults is analyzed. It is shown that this problem cannot be ignored if high-quality tests are required, and that assuming the worst-case condition and using conventional testing techniques may dramatically reduce the detectability of stuck-open faults. The authors present a layout-driven method to characterize this problem and show that by a monitoring of the current supply this problem becomes much easier to solve. Through the use of current supply monitoring a very high improvement factor, which can easily offset the error caused by imprecise estimations of capacitance, has been obtained. It is demonstrated that by slight modification of the layout of a circuit the charge-sharing problem can be eliminated. A robust test generation procedure is also presented.

Original languageEnglish
Title of host publicationDigest of Papers - International Test Conference
PublisherPubl by IEEE
Pages417-426
Number of pages10
ISBN (Print)0818620641
Publication statusPublished - 1990 Sep 1
EventProceedings - International Test Conference 1990 - Washington, DC, USA
Duration: 1990 Sep 101990 Sep 14

Publication series

NameDigest of Papers - International Test Conference
ISSN (Print)0743-1686

Other

OtherProceedings - International Test Conference 1990
CityWashington, DC, USA
Period90-09-1090-09-14

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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