Abstract
For metals and alloys, electric currents may induce atomic diffusion and morphological changes, known as the electromigration (EM) effect. Here we report the first direct application of conventional solid mechanics’ theory to predict the electric current-induced deformations based on the in situ electron backscattered diffraction and synchrotron radiation-based X-ray diffraction analyses of Cu strips under current stressing. At a given current density, the electric current-induced elastic, slip, or slip accompanying with twinning deformation in Cu strips was revealed. The Schmid's Law is well elucidating the occurrence of the electric current-induced plastic deformations, namely the slip and twinning ones. The study unveils that the electric current-induced strain and deformation can be described in the same context as for the conventional solid mechanics.
| Original language | English |
|---|---|
| Article number | 105295 |
| Journal | International Journal of Mechanical Sciences |
| Volume | 168 |
| DOIs | |
| Publication status | Published - 2020 Feb 15 |
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All Science Journal Classification (ASJC) codes
- Civil and Structural Engineering
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
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On the Schmid's Law for the electric current-induced deformation : An in situ EBSD study. / Liu, Yu chen; Lin, Shih kang; Chiu, Shang Jui.
In: International Journal of Mechanical Sciences, Vol. 168, 105295, 15.02.2020.Research output: Contribution to journal › Article
TY - JOUR
T1 - On the Schmid's Law for the electric current-induced deformation
T2 - An in situ EBSD study
AU - Liu, Yu chen
AU - Lin, Shih kang
AU - Chiu, Shang Jui
PY - 2020/2/15
Y1 - 2020/2/15
N2 - For metals and alloys, electric currents may induce atomic diffusion and morphological changes, known as the electromigration (EM) effect. Here we report the first direct application of conventional solid mechanics’ theory to predict the electric current-induced deformations based on the in situ electron backscattered diffraction and synchrotron radiation-based X-ray diffraction analyses of Cu strips under current stressing. At a given current density, the electric current-induced elastic, slip, or slip accompanying with twinning deformation in Cu strips was revealed. The Schmid's Law is well elucidating the occurrence of the electric current-induced plastic deformations, namely the slip and twinning ones. The study unveils that the electric current-induced strain and deformation can be described in the same context as for the conventional solid mechanics.
AB - For metals and alloys, electric currents may induce atomic diffusion and morphological changes, known as the electromigration (EM) effect. Here we report the first direct application of conventional solid mechanics’ theory to predict the electric current-induced deformations based on the in situ electron backscattered diffraction and synchrotron radiation-based X-ray diffraction analyses of Cu strips under current stressing. At a given current density, the electric current-induced elastic, slip, or slip accompanying with twinning deformation in Cu strips was revealed. The Schmid's Law is well elucidating the occurrence of the electric current-induced plastic deformations, namely the slip and twinning ones. The study unveils that the electric current-induced strain and deformation can be described in the same context as for the conventional solid mechanics.
UR - http://www.scopus.com/inward/record.url?scp=85074630534&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85074630534&partnerID=8YFLogxK
U2 - 10.1016/j.ijmecsci.2019.105295
DO - 10.1016/j.ijmecsci.2019.105295
M3 - Article
AN - SCOPUS:85074630534
VL - 168
JO - International Journal of Mechanical Sciences
JF - International Journal of Mechanical Sciences
SN - 0020-7403
M1 - 105295
ER -