Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface

Darius Kuciauskas; Joel N. Duenow; Ana Kanevce; Jian V. Li; Matthew R. Young; Pat Dippo; Dean H. Levi

doi:10.1109/PVSC.2012.6317927

Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface

Darius Kuciauskas, Joel N. Duenow, Ana Kanevce, Jian V. Li, Matthew R. Young, Pat Dippo, Dean H. Levi

Department of Aeronautics and Astronautics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

37 Citations (Scopus)

Abstract

We describe the design of a time resolved photoluminescence (TRPL) spectrometer for rapid semiconductor absorber characterization. Simplicity and flexibility is achieved by using single optical fiber to deliver laser pulses and to collect photoluminescence. We apply TRPL for characterization of CdS/CdTe absorbers after deposition, CdCl₂ treatment, Cu doping, and back contact formation. Data suggest this method could be applied in various stages of PV device processing. Finally, we show how to analyze TRPL data for CdS/CdTe absorbers by considering laser light absorption depth and intermixing at CdS/CdTe interface.

Original language	English
Title of host publication	Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Pages	1721-1726
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2012.6317927
Publication status	Published - 2012
Event	38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States Duration: 2012 Jun 3 → 2012 Jun 8

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Country/Territory	United States
City	Austin, TX
Period	12-06-03 → 12-06-08

All Science Journal Classification (ASJC) codes

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2012.6317927

Cite this

Kuciauskas, D., Duenow, J. N., Kanevce, A., Li, J. V., Young, M. R., Dippo, P., & Levi, D. H. (2012). Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 (pp. 1721-1726). [6317927] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2012.6317927

Kuciauskas, Darius ; Duenow, Joel N. ; Kanevce, Ana et al. / Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface. Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. pp. 1721-1726 (Conference Record of the IEEE Photovoltaic Specialists Conference).

@inproceedings{e37ae261330c4c19b062f77c26b64dba,

title = "Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface",

abstract = "We describe the design of a time resolved photoluminescence (TRPL) spectrometer for rapid semiconductor absorber characterization. Simplicity and flexibility is achieved by using single optical fiber to deliver laser pulses and to collect photoluminescence. We apply TRPL for characterization of CdS/CdTe absorbers after deposition, CdCl2 treatment, Cu doping, and back contact formation. Data suggest this method could be applied in various stages of PV device processing. Finally, we show how to analyze TRPL data for CdS/CdTe absorbers by considering laser light absorption depth and intermixing at CdS/CdTe interface.",

author = "Darius Kuciauskas and Duenow, {Joel N.} and Ana Kanevce and Li, {Jian V.} and Young, {Matthew R.} and Pat Dippo and Levi, {Dean H.}",

year = "2012",

doi = "10.1109/PVSC.2012.6317927",

language = "English",

isbn = "9781467300643",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

pages = "1721--1726",

booktitle = "Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012",

note = "38th IEEE Photovoltaic Specialists Conference, PVSC 2012 ; Conference date: 03-06-2012 Through 08-06-2012",

}

Kuciauskas, D, Duenow, JN, Kanevce, A, Li, JV, Young, MR, Dippo, P & Levi, DH 2012, Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface. in Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012., 6317927, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 1721-1726, 38th IEEE Photovoltaic Specialists Conference, PVSC 2012, Austin, TX, United States, 12-06-03. https://doi.org/10.1109/PVSC.2012.6317927

Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface. / Kuciauskas, Darius; Duenow, Joel N.; Kanevce, Ana et al.

Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. p. 1721-1726 6317927 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface

AU - Kuciauskas, Darius

AU - Duenow, Joel N.

AU - Kanevce, Ana

AU - Li, Jian V.

AU - Young, Matthew R.

AU - Dippo, Pat

AU - Levi, Dean H.

PY - 2012

Y1 - 2012

N2 - We describe the design of a time resolved photoluminescence (TRPL) spectrometer for rapid semiconductor absorber characterization. Simplicity and flexibility is achieved by using single optical fiber to deliver laser pulses and to collect photoluminescence. We apply TRPL for characterization of CdS/CdTe absorbers after deposition, CdCl2 treatment, Cu doping, and back contact formation. Data suggest this method could be applied in various stages of PV device processing. Finally, we show how to analyze TRPL data for CdS/CdTe absorbers by considering laser light absorption depth and intermixing at CdS/CdTe interface.

AB - We describe the design of a time resolved photoluminescence (TRPL) spectrometer for rapid semiconductor absorber characterization. Simplicity and flexibility is achieved by using single optical fiber to deliver laser pulses and to collect photoluminescence. We apply TRPL for characterization of CdS/CdTe absorbers after deposition, CdCl2 treatment, Cu doping, and back contact formation. Data suggest this method could be applied in various stages of PV device processing. Finally, we show how to analyze TRPL data for CdS/CdTe absorbers by considering laser light absorption depth and intermixing at CdS/CdTe interface.

UR - http://www.scopus.com/inward/record.url?scp=84869451867&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84869451867&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2012.6317927

DO - 10.1109/PVSC.2012.6317927

M3 - Conference contribution

AN - SCOPUS:84869451867

SN - 9781467300643

T3 - Conference Record of the IEEE Photovoltaic Specialists Conference

SP - 1721

EP - 1726

BT - Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012

T2 - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012

Y2 - 3 June 2012 through 8 June 2012

ER -

Kuciauskas D, Duenow JN, Kanevce A, Li JV, Young MR, Dippo P et al. Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. p. 1721-1726. 6317927. (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2012.6317927

Optical-fiber-based, time-resolved photoluminescence spectrometer for thin-film absorber characterization and analysis of TRPL data for CdS/CdTe interface

Abstract

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