Optical transitions in a self-assembled Ge quantum Dot/Si superlattice measured by photoreflectance spectroscopy

Chie In Lee, Yan Ten Lu, Yan Kuin Su, Shoou Jinn Chang, Jenn Shyong Hwang, Chung Chih Chang

Research output: Contribution to journalArticle

Abstract

We report the first room-temperature photoreflectance (PR) measurement for self-assemble Ge quantum dot/Si superlattice grown by chemical vapor deposition (CVD) system. The relevant critical energies of transitions are obtained through fitting the PR spectrum. They are in good agreement with the result of theoretical calculations for the wetting layer with strain and a quantum dot of disk shape.

Original languageEnglish
Pages (from-to)L1045-L1047
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume44
Issue number33-36
DOIs
Publication statusPublished - 2005 Aug 26

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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