Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators

Shu Han Hsu; Ying Yuan Huang; Yi Da Wu; Kexin Yang; Li Hsiang Lin; Linda Milor

doi:10.1016/j.microrel.2020.113753

Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators

Shu Han Hsu, Ying Yuan Huang, Yi Da Wu, Kexin Yang, Li Hsiang Lin, Linda Milor

Research output: Contribution to journal › Article › peer-review

Abstract

The accuracy of accelerated lifetime tests may vary due to the choice of test conditions, which presents a problem in interpreting results. Furthermore, testing is generally performed on test structures which are simplified compared to circuits and systems. To have an in-depth understanding on the actual usage conditions, we use 14 nm FinFET ring oscillator as the test vehicle for accelerated testing, focusing on detecting front-end time dependent dielectric breakdown. The factors impacting errors in lifetime estimation are investigated, such as sample size, testing times, and number of inverters in the ring oscillators.

Original language	English
Article number	113753
Journal	Microelectronics Reliability
Volume	114
DOIs	https://doi.org/10.1016/j.microrel.2020.113753
Publication status	Published - 2020 Nov

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Safety, Risk, Reliability and Quality
Surfaces, Coatings and Films
Electrical and Electronic Engineering

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10.1016/j.microrel.2020.113753

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title = "Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators",

abstract = "The accuracy of accelerated lifetime tests may vary due to the choice of test conditions, which presents a problem in interpreting results. Furthermore, testing is generally performed on test structures which are simplified compared to circuits and systems. To have an in-depth understanding on the actual usage conditions, we use 14 nm FinFET ring oscillator as the test vehicle for accelerated testing, focusing on detecting front-end time dependent dielectric breakdown. The factors impacting errors in lifetime estimation are investigated, such as sample size, testing times, and number of inverters in the ring oscillators.",

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AU - Huang, Ying Yuan

AU - Wu, Yi Da

AU - Yang, Kexin

AU - Lin, Li Hsiang

AU - Milor, Linda

PY - 2020/11

Y1 - 2020/11

N2 - The accuracy of accelerated lifetime tests may vary due to the choice of test conditions, which presents a problem in interpreting results. Furthermore, testing is generally performed on test structures which are simplified compared to circuits and systems. To have an in-depth understanding on the actual usage conditions, we use 14 nm FinFET ring oscillator as the test vehicle for accelerated testing, focusing on detecting front-end time dependent dielectric breakdown. The factors impacting errors in lifetime estimation are investigated, such as sample size, testing times, and number of inverters in the ring oscillators.

AB - The accuracy of accelerated lifetime tests may vary due to the choice of test conditions, which presents a problem in interpreting results. Furthermore, testing is generally performed on test structures which are simplified compared to circuits and systems. To have an in-depth understanding on the actual usage conditions, we use 14 nm FinFET ring oscillator as the test vehicle for accelerated testing, focusing on detecting front-end time dependent dielectric breakdown. The factors impacting errors in lifetime estimation are investigated, such as sample size, testing times, and number of inverters in the ring oscillators.

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JO - Microelectronics Reliability

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Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators

Abstract

All Science Journal Classification (ASJC) codes

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