Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators

Shu Han Hsu, Ying Yuan Huang, Yi Da Wu, Kexin Yang, Li Hsiang Lin, Linda Milor

Research output: Contribution to journalArticlepeer-review


The accuracy of accelerated lifetime tests may vary due to the choice of test conditions, which presents a problem in interpreting results. Furthermore, testing is generally performed on test structures which are simplified compared to circuits and systems. To have an in-depth understanding on the actual usage conditions, we use 14 nm FinFET ring oscillator as the test vehicle for accelerated testing, focusing on detecting front-end time dependent dielectric breakdown. The factors impacting errors in lifetime estimation are investigated, such as sample size, testing times, and number of inverters in the ring oscillators.

Original languageEnglish
Article number113753
JournalMicroelectronics Reliability
Publication statusPublished - 2020 Nov

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering


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