Optimum Allocation Rule for Accelerated Degradation Tests with a Class of Exponential-Dispersion Degradation Models

Sheng Tsaing Tseng, I-Chen Lee

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

Optimum allocation problem in accelerated degradation tests (ADTs) is an important task for reliability analysts. Several researchers have attempted to address this decision problem, but their results have been based only on specific degradation models. Therefore, they lack a unified approach toward general degradation models. This study proposes a class of exponential dispersion (ED) degradation models to overcome this difficulty. Assuming that the underlying degradation path comes from the ED class, we analytically derive the optimum allocation rules (by minimizing the asymptotic variance of the estimated q quantile of product's lifetime) for two-level and three-level ADT allocation problems whether the testing stress levels are prefixed or not. For a three-level allocation problem, we show that all test units should be allocated into two out of three stresses, depending on certain specific conditions. Two examples are used to illustrate the proposed procedure. Furthermore, the penalties of using nonoptimum allocation rules are also addressed. This study demonstrates that a three-level compromise plan with small proportion allocation in the middle stress, in general, is a good strategy for ADT allocation. Supplementary materials for this article are available online.

Original languageEnglish
Pages (from-to)244-254
Number of pages11
JournalTechnometrics
Volume58
Issue number2
DOIs
Publication statusPublished - 2016 Apr 2

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Degradation
Model
Asymptotic Variance
Class
Quantile
Decision problem
Penalty
Lifetime
Proportion
Testing
Path
Unit
Demonstrate

All Science Journal Classification (ASJC) codes

  • Statistics and Probability
  • Modelling and Simulation
  • Applied Mathematics

Cite this

@article{95ad65eafdf64610adf89682de06211c,
title = "Optimum Allocation Rule for Accelerated Degradation Tests with a Class of Exponential-Dispersion Degradation Models",
abstract = "Optimum allocation problem in accelerated degradation tests (ADTs) is an important task for reliability analysts. Several researchers have attempted to address this decision problem, but their results have been based only on specific degradation models. Therefore, they lack a unified approach toward general degradation models. This study proposes a class of exponential dispersion (ED) degradation models to overcome this difficulty. Assuming that the underlying degradation path comes from the ED class, we analytically derive the optimum allocation rules (by minimizing the asymptotic variance of the estimated q quantile of product's lifetime) for two-level and three-level ADT allocation problems whether the testing stress levels are prefixed or not. For a three-level allocation problem, we show that all test units should be allocated into two out of three stresses, depending on certain specific conditions. Two examples are used to illustrate the proposed procedure. Furthermore, the penalties of using nonoptimum allocation rules are also addressed. This study demonstrates that a three-level compromise plan with small proportion allocation in the middle stress, in general, is a good strategy for ADT allocation. Supplementary materials for this article are available online.",
author = "Tseng, {Sheng Tsaing} and I-Chen Lee",
year = "2016",
month = "4",
day = "2",
doi = "10.1080/00401706.2015.1033109",
language = "English",
volume = "58",
pages = "244--254",
journal = "Technometrics",
issn = "0040-1706",
publisher = "American Statistical Association",
number = "2",

}

Optimum Allocation Rule for Accelerated Degradation Tests with a Class of Exponential-Dispersion Degradation Models. / Tseng, Sheng Tsaing; Lee, I-Chen.

In: Technometrics, Vol. 58, No. 2, 02.04.2016, p. 244-254.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Optimum Allocation Rule for Accelerated Degradation Tests with a Class of Exponential-Dispersion Degradation Models

AU - Tseng, Sheng Tsaing

AU - Lee, I-Chen

PY - 2016/4/2

Y1 - 2016/4/2

N2 - Optimum allocation problem in accelerated degradation tests (ADTs) is an important task for reliability analysts. Several researchers have attempted to address this decision problem, but their results have been based only on specific degradation models. Therefore, they lack a unified approach toward general degradation models. This study proposes a class of exponential dispersion (ED) degradation models to overcome this difficulty. Assuming that the underlying degradation path comes from the ED class, we analytically derive the optimum allocation rules (by minimizing the asymptotic variance of the estimated q quantile of product's lifetime) for two-level and three-level ADT allocation problems whether the testing stress levels are prefixed or not. For a three-level allocation problem, we show that all test units should be allocated into two out of three stresses, depending on certain specific conditions. Two examples are used to illustrate the proposed procedure. Furthermore, the penalties of using nonoptimum allocation rules are also addressed. This study demonstrates that a three-level compromise plan with small proportion allocation in the middle stress, in general, is a good strategy for ADT allocation. Supplementary materials for this article are available online.

AB - Optimum allocation problem in accelerated degradation tests (ADTs) is an important task for reliability analysts. Several researchers have attempted to address this decision problem, but their results have been based only on specific degradation models. Therefore, they lack a unified approach toward general degradation models. This study proposes a class of exponential dispersion (ED) degradation models to overcome this difficulty. Assuming that the underlying degradation path comes from the ED class, we analytically derive the optimum allocation rules (by minimizing the asymptotic variance of the estimated q quantile of product's lifetime) for two-level and three-level ADT allocation problems whether the testing stress levels are prefixed or not. For a three-level allocation problem, we show that all test units should be allocated into two out of three stresses, depending on certain specific conditions. Two examples are used to illustrate the proposed procedure. Furthermore, the penalties of using nonoptimum allocation rules are also addressed. This study demonstrates that a three-level compromise plan with small proportion allocation in the middle stress, in general, is a good strategy for ADT allocation. Supplementary materials for this article are available online.

UR - http://www.scopus.com/inward/record.url?scp=84964434679&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84964434679&partnerID=8YFLogxK

U2 - 10.1080/00401706.2015.1033109

DO - 10.1080/00401706.2015.1033109

M3 - Article

VL - 58

SP - 244

EP - 254

JO - Technometrics

JF - Technometrics

SN - 0040-1706

IS - 2

ER -