Abstract

Zinc oxide (ZnO) films with two-dimensional (2D) vertically aligned nanowalls, denoted by nanowalls-films, are successfully prepared on glass substrates at a low growth temperature of 450 °C without using metal catalysts. The morphology and optical properties of the nanowalls-film are characterized by scanning electron microscopy, X-ray diffraction analysis, transmission electron microscopy, energy dispersive X-ray spectroscopy, and photoluminescence measurement. The ZnO nanowalls-film show a strong UV emission and a preferred c-axis orientation with a hexagonal structure. The UV sensor measurement of the ZnO nanowalls-film shows a high sensitivity to UV light, rapid rise and decay times, and a good UV-to-visible rejection ratio.

Original languageEnglish
Article number045201
JournalApplied Physics Express
Volume6
Issue number4
DOIs
Publication statusPublished - 2013 Apr 1

Fingerprint

Zinc oxide
zinc oxides
Optoelectronic devices
Oxide films
oxide films
Glass
glass
Substrates
Growth temperature
Ultraviolet radiation
rejection
X ray diffraction analysis
Photoluminescence
x rays
Optical properties
Transmission electron microscopy
photoluminescence
optical properties
catalysts
transmission electron microscopy

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

@article{ffbd1e462cd04b3b89b30cd1b1751e40,
title = "Optoelectronic properties of thermally evaporated zno films with nanowalls on glass substrates",
abstract = "Zinc oxide (ZnO) films with two-dimensional (2D) vertically aligned nanowalls, denoted by nanowalls-films, are successfully prepared on glass substrates at a low growth temperature of 450 °C without using metal catalysts. The morphology and optical properties of the nanowalls-film are characterized by scanning electron microscopy, X-ray diffraction analysis, transmission electron microscopy, energy dispersive X-ray spectroscopy, and photoluminescence measurement. The ZnO nanowalls-film show a strong UV emission and a preferred c-axis orientation with a hexagonal structure. The UV sensor measurement of the ZnO nanowalls-film shows a high sensitivity to UV light, rapid rise and decay times, and a good UV-to-visible rejection ratio.",
author = "Chen, {Tse Pu} and Hung, {Fei Yi} and Chang, {Sheng Po} and Chang, {Shoou Jinn} and Hu, {Zhan Shuo} and Chen, {Kuan Jen}",
year = "2013",
month = "4",
day = "1",
doi = "10.7567/APEX.6.045201",
language = "English",
volume = "6",
journal = "Applied Physics Express",
issn = "1882-0778",
publisher = "Japan Society of Applied Physics",
number = "4",

}

Optoelectronic properties of thermally evaporated zno films with nanowalls on glass substrates. / Chen, Tse Pu; Hung, Fei Yi; Chang, Sheng Po; Chang, Shoou Jinn; Hu, Zhan Shuo; Chen, Kuan Jen.

In: Applied Physics Express, Vol. 6, No. 4, 045201, 01.04.2013.

Research output: Contribution to journalArticle

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AU - Hung, Fei Yi

AU - Chang, Sheng Po

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AU - Chen, Kuan Jen

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AB - Zinc oxide (ZnO) films with two-dimensional (2D) vertically aligned nanowalls, denoted by nanowalls-films, are successfully prepared on glass substrates at a low growth temperature of 450 °C without using metal catalysts. The morphology and optical properties of the nanowalls-film are characterized by scanning electron microscopy, X-ray diffraction analysis, transmission electron microscopy, energy dispersive X-ray spectroscopy, and photoluminescence measurement. The ZnO nanowalls-film show a strong UV emission and a preferred c-axis orientation with a hexagonal structure. The UV sensor measurement of the ZnO nanowalls-film shows a high sensitivity to UV light, rapid rise and decay times, and a good UV-to-visible rejection ratio.

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