Oscillation-test technique for buck voltage regulator

Jing Yi Huang, Chun Hsun Wu, Le Ren Chang-Chien, Soon Jyh Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, a vector-less simple technique based on the oscillation-test strategy (OTS) is proposed for the test of the Buck regulator. In the test mode, the circuit under test (CUT) of the buck regulator could be easily transformed into an oscillator for generating the oscillating signal. By observing the frequency and amplitude of the oscillating signal, we could detect the CUT to see if it is faulty or fault-free. Simulation results show that the fault coverage for hard faults could reach up to 99%. Based on the facts of the simple structure and high fault coverage, OTS is considered as a useful technique in the testing of the Buck regulator.

Original languageEnglish
Title of host publicationAPEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition
Pages1043-1047
Number of pages5
DOIs
Publication statusPublished - 2010 May 18
Event25th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2010 - Palm Springs, CA, United States
Duration: 2010 Feb 212010 Feb 25

Publication series

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Other

Other25th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2010
CountryUnited States
CityPalm Springs, CA
Period10-02-2110-02-25

Fingerprint

Voltage regulators
Networks (circuits)
Testing

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Huang, J. Y., Wu, C. H., Chang-Chien, L. R., & Chang, S. J. (2010). Oscillation-test technique for buck voltage regulator. In APEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition (pp. 1043-1047). [5433374] (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). https://doi.org/10.1109/APEC.2010.5433374
Huang, Jing Yi ; Wu, Chun Hsun ; Chang-Chien, Le Ren ; Chang, Soon Jyh. / Oscillation-test technique for buck voltage regulator. APEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition. 2010. pp. 1043-1047 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).
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Huang, JY, Wu, CH, Chang-Chien, LR & Chang, SJ 2010, Oscillation-test technique for buck voltage regulator. in APEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition., 5433374, Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC, pp. 1043-1047, 25th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2010, Palm Springs, CA, United States, 10-02-21. https://doi.org/10.1109/APEC.2010.5433374

Oscillation-test technique for buck voltage regulator. / Huang, Jing Yi; Wu, Chun Hsun; Chang-Chien, Le Ren; Chang, Soon Jyh.

APEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition. 2010. p. 1043-1047 5433374 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Huang JY, Wu CH, Chang-Chien LR, Chang SJ. Oscillation-test technique for buck voltage regulator. In APEC 2010 - 25th Annual IEEE Applied Power Electronics Conference and Exposition. 2010. p. 1043-1047. 5433374. (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). https://doi.org/10.1109/APEC.2010.5433374