Oscillator-based reconfigurable sinusoidal signal generator for ADC BIST

Hsin Wen Ting, Cheng Wu Lin, Bin-Da Liu, Soon-Jyh Chang

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an oscillator-based reconfigurable sinusoidal signal generator which can produce both high and low frequency sinusoidal signals by switching the oscillator into different modes. Analog and digital signals can additionally be produced concurrently in both modes to provide not only test stimuli, but also reference responses for the ADC built-in self-test. The generated oscillation signal amplitude and frequency can be easily and precisely controlled by simply setting the oscillator clock frequency and initial condition coefficients. Except for a 1-bit digital-to-analog converter and smoothing filter, this proposed generator is constructed entirely by digital circuits, and hence easily integrates this silicon function and verifies itself before testing the ADCs.

Original languageEnglish
Pages (from-to)549-558
Number of pages10
JournalJournal of Electronic Testing: Theory and Applications (JETTA)
Volume23
Issue number6
DOIs
Publication statusPublished - 2007 Dec 1

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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