Overall consideration of scan design and test generation

Pao Chuan Chen, Bin Da Liu, Jhing Fa Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

21 Citations (Scopus)

Abstract

Different from the previous approaches that enhance the abilities of the test generation algorithm, scan cell selection strategy and structure of scan chain individually, a complete system taking all these factors into account is developed. The goal of this research is to reduce the extra-costs caused by the scan design, especially the test application time. Experimental results show that the overall consideration of scan design and test generation can speed up test generation and reduce great amount of test application time.

Original languageEnglish
Title of host publicationIEEE/ACM International Conference on Computer-Aided Design
PublisherPubl by IEEE
Pages9-12
Number of pages4
ISBN (Print)0818630108
Publication statusPublished - 1992 Dec 1
EventIEEE/ACM International Conference on Computer-Aided Design - ICCAD '92 - Santa Clara, CA, USA
Duration: 1992 Nov 81992 Nov 12

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design

Other

OtherIEEE/ACM International Conference on Computer-Aided Design - ICCAD '92
CitySanta Clara, CA, USA
Period92-11-0892-11-12

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Chen, P. C., Liu, B. D., & Wang, J. F. (1992). Overall consideration of scan design and test generation. In IEEE/ACM International Conference on Computer-Aided Design (pp. 9-12). (IEEE/ACM International Conference on Computer-Aided Design). Publ by IEEE.