Oxygen transport in oxide thin film structures. Oriented La0.5Sr0.5CoO3-x on single-crystal yttria-stabilized zirconia

C. A. Mims, N. I. Joos, P. A.W. Van Der Heide, A. J. Jacobson, C. Chen, C. W. Chu, B. I. Kim, S. S. Perry

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Abstract

Oriented thin films of La0.5Sr0.5CoO3-x were deposited on single-crystal 9.5 mol% Y2O3 stabilized ZrO2 by laser deposition. The films were infused with 18O by exchange with 20 kPa O2 at 300-400 °C, then quenched and depth profiled by secondary ion mass spectroscopy. Analysis of the depth profiles revealed a significant barrier to interfacial transport at these relatively low temperatures.

Original languageEnglish
Pages (from-to)59-61
Number of pages3
JournalElectrochemical and Solid-State Letters
Volume3
Issue number1
DOIs
Publication statusPublished - 2000 Jan

All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Materials Science(all)
  • Physical and Theoretical Chemistry
  • Electrochemistry
  • Electrical and Electronic Engineering

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