P-39: A highly stable a-Si:H TFT gate driver circuit with reducing clock duty ratio

Chih-Lung Lin, Chun Da Tu, Min Chin Chuang, Kuan Wen Chou, Chia Che Hung, Chih Wei Wang, Min Feng Chiang, Yung Chih Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

Abstract

This paper presents a new a-Si:H gate driver circuit for large panel applications. Consisting of 12 TFTs and three capacitors, the proposed circuit is fabricated for measurement The threshold voltage shift of TFTs is significantly reduced by reducing clock duty ratio. Experimental results indicate that the gate driver circuit operates stably under long-term and high temperature testing.

Original languageEnglish
Title of host publication48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010
Pages1360-1362
Number of pages3
Publication statusPublished - 2010 Dec 1
Event48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010 - Seattle, WA, United States
Duration: 2010 May 232010 May 28

Publication series

Name48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010
Volume3

Other

Other48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010
CountryUnited States
CitySeattle, WA
Period10-05-2310-05-28

Fingerprint

Clocks
Networks (circuits)
High temperature testing
Threshold voltage
Capacitors

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Information Systems

Cite this

Lin, C-L., Tu, C. D., Chuang, M. C., Chou, K. W., Hung, C. C., Wang, C. W., ... Chen, Y. C. (2010). P-39: A highly stable a-Si:H TFT gate driver circuit with reducing clock duty ratio. In 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010 (pp. 1360-1362). (48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010; Vol. 3).
Lin, Chih-Lung ; Tu, Chun Da ; Chuang, Min Chin ; Chou, Kuan Wen ; Hung, Chia Che ; Wang, Chih Wei ; Chiang, Min Feng ; Chen, Yung Chih. / P-39 : A highly stable a-Si:H TFT gate driver circuit with reducing clock duty ratio. 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010. 2010. pp. 1360-1362 (48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010).
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abstract = "This paper presents a new a-Si:H gate driver circuit for large panel applications. Consisting of 12 TFTs and three capacitors, the proposed circuit is fabricated for measurement The threshold voltage shift of TFTs is significantly reduced by reducing clock duty ratio. Experimental results indicate that the gate driver circuit operates stably under long-term and high temperature testing.",
author = "Chih-Lung Lin and Tu, {Chun Da} and Chuang, {Min Chin} and Chou, {Kuan Wen} and Hung, {Chia Che} and Wang, {Chih Wei} and Chiang, {Min Feng} and Chen, {Yung Chih}",
year = "2010",
month = "12",
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language = "English",
isbn = "9781618390950",
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Lin, C-L, Tu, CD, Chuang, MC, Chou, KW, Hung, CC, Wang, CW, Chiang, MF & Chen, YC 2010, P-39: A highly stable a-Si:H TFT gate driver circuit with reducing clock duty ratio. in 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010. 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010, vol. 3, pp. 1360-1362, 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010, Seattle, WA, United States, 10-05-23.

P-39 : A highly stable a-Si:H TFT gate driver circuit with reducing clock duty ratio. / Lin, Chih-Lung; Tu, Chun Da; Chuang, Min Chin; Chou, Kuan Wen; Hung, Chia Che; Wang, Chih Wei; Chiang, Min Feng; Chen, Yung Chih.

48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010. 2010. p. 1360-1362 (48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010; Vol. 3).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Lin C-L, Tu CD, Chuang MC, Chou KW, Hung CC, Wang CW et al. P-39: A highly stable a-Si:H TFT gate driver circuit with reducing clock duty ratio. In 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010. 2010. p. 1360-1362. (48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010).