@inproceedings{09f2ce7fa3634033b6182dd9be46b161,
title = "Parcript: A very fast combinational fault simulator",
abstract = "A new combinational fault simulator, PARCRIPT, which combines the merits of the concept of the parallel fault simulation and the efficiency of the critical path tracing (CRIPT), is presented. The key idea of PARCRIPT is to simultaneously propagate the criticalities of the potential stems to determine whether a potential stem is critical. Critical path tracing then traces from the critical potential stem to find the detected faults inside the fanout-free region. Our experimental results show that PARCRIPT run 2-5 times faster than PROOFS for 10 combinational benchmark circuits.",
author = "Jou, {Jer Min} and Chen, {Shung Chih}",
year = "1993",
month = jan,
day = "1",
doi = "10.1109/VTSA.1993.263626",
language = "English",
series = "International Symposium on VLSI Technology, Systems, and Applications, Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "54--57",
booktitle = "1993 International Symposium on VLSI Technology, Systems, and Applications, VLSI-TSA 1993 - Proceedings of Technical Papers",
address = "United States",
note = "1993 International Symposium on VLSI Technology, Systems, and Applications, VLSI-TSA 1993 ; Conference date: 12-05-1993 Through 14-05-1993",
}