Abstract
An electrostatic particle-in-cell simulation code is developed to investigate the interaction between plasma and material surfaces in the presence of secondary electron emission. Kinetic ions are included into the numerical simulation to incorporate the process of ion bombardment on the material surfaces. The influences of the secondary electron emission on sheath dynamics are further investigated, which is induced by ions on top of electrons.
| Original language | English |
|---|---|
| Article number | 7001683 |
| Pages (from-to) | 675-682 |
| Number of pages | 8 |
| Journal | IEEE Transactions on Plasma Science |
| Volume | 43 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 2015 Feb 1 |
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All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics
- Condensed Matter Physics
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Particle-in-cell simulation of plasma sheath dynamics with kinetic ions. / Huang, Chun Wei; Chen, Yen Chiao; Nishimura, Yasutaro.
In: IEEE Transactions on Plasma Science, Vol. 43, No. 2, 7001683, 01.02.2015, p. 675-682.Research output: Contribution to journal › Article
TY - JOUR
T1 - Particle-in-cell simulation of plasma sheath dynamics with kinetic ions
AU - Huang, Chun Wei
AU - Chen, Yen Chiao
AU - Nishimura, Yasutaro
PY - 2015/2/1
Y1 - 2015/2/1
N2 - An electrostatic particle-in-cell simulation code is developed to investigate the interaction between plasma and material surfaces in the presence of secondary electron emission. Kinetic ions are included into the numerical simulation to incorporate the process of ion bombardment on the material surfaces. The influences of the secondary electron emission on sheath dynamics are further investigated, which is induced by ions on top of electrons.
AB - An electrostatic particle-in-cell simulation code is developed to investigate the interaction between plasma and material surfaces in the presence of secondary electron emission. Kinetic ions are included into the numerical simulation to incorporate the process of ion bombardment on the material surfaces. The influences of the secondary electron emission on sheath dynamics are further investigated, which is induced by ions on top of electrons.
UR - http://www.scopus.com/inward/record.url?scp=85027942258&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85027942258&partnerID=8YFLogxK
U2 - 10.1109/TPS.2014.2382876
DO - 10.1109/TPS.2014.2382876
M3 - Article
VL - 43
SP - 675
EP - 682
JO - IEEE Transactions on Plasma Science
JF - IEEE Transactions on Plasma Science
SN - 0093-3813
IS - 2
M1 - 7001683
ER -