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Pattern Matching for Feasible and Efficient Physical Design Verification of Cell Libraries
Chan Liang Wu
, Chih Wen Lu
Program on Integrated Circuit Design
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peer-review
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Keyphrases
Physical Design
100%
Pattern Matching
100%
O-cell
100%
Design Verification
100%
Cell Library
100%
Pattern Matching Method
66%
Layer Density
66%
Tion
33%
Physical Verification
33%
IC Layout
33%
Fication
33%
Unit Libraries
33%
Infinite Duration
33%
Engineering
Design Verification
100%
Pattern Matching
100%
Matching Method
66%
Material Science
Density
100%
Computer Science
Constraint Machine
12%