Performance-aware corner model for design for manufacturing

Chung Hsun Lin, Mohan V. Dunga, Darsen D. Lu, Ali M. Niknejad, Chenming Hu

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

We present a methodology to generate performance-aware corner models (PAMs). Accuracy is improved by emphasizing electrical variation data and reconciling the process and electrical variation data. PAM supports corner (± σ and ±2σ) simulation and Monte Carlo simulation. Furthermore, PAM supports the practice of application-specific corner cards, for example, for gain-sensitive applications.

Original languageEnglish
Pages (from-to)595-600
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume56
Issue number4
DOIs
Publication statusPublished - 2009 Mar 10

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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