Perpendicular interface resistance in CoNb xTi 1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6

S. Y. Huang; S. F. Lee; J. C. Huang; G. H. Hwang; Y. D. Yao

doi:10.1063/1.1850373

Perpendicular interface resistance in CoNb _xTi _1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6

S. Y. Huang, S. F. Lee, J. C. Huang, G. H. Hwang, Y. D. Yao

Department of Physics

Research output: Contribution to journal › Article › peer-review

Abstract

We report here the resistance of Co Nbx Ti1-x multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of CoNbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed.

Original language	English
Article number	10B103
Journal	Journal of Applied Physics
Volume	97
Issue number	10
DOIs	https://doi.org/10.1063/1.1850373
Publication status	Published - 2005 May 15

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.1850373

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@article{327b508c75fc48489a624b93a308f95c,

title = "Perpendicular interface resistance in CoNb xTi 1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6",

abstract = "We report here the resistance of Co Nbx Ti1-x multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of CoNbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed.",

author = "Huang, {S. Y.} and Lee, {S. F.} and Huang, {J. C.} and Hwang, {G. H.} and Yao, {Y. D.}",

year = "2005",

month = may,

day = "15",

doi = "10.1063/1.1850373",

language = "English",

volume = "97",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "10",

}

TY - JOUR

T1 - Perpendicular interface resistance in CoNb xTi 1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6

AU - Huang, S. Y.

AU - Lee, S. F.

AU - Huang, J. C.

AU - Hwang, G. H.

AU - Yao, Y. D.

PY - 2005/5/15

Y1 - 2005/5/15

N2 - We report here the resistance of Co Nbx Ti1-x multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of CoNbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed.

AB - We report here the resistance of Co Nbx Ti1-x multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of CoNbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed.

UR - http://www.scopus.com/inward/record.url?scp=20944441168&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=20944441168&partnerID=8YFLogxK

U2 - 10.1063/1.1850373

DO - 10.1063/1.1850373

M3 - Article

AN - SCOPUS:20944441168

SN - 0021-8979

VL - 97

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10

M1 - 10B103

ER -

Perpendicular interface resistance in CoNb _xTi _1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6

Abstract

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