Perpendicular interface resistance in CoNb xTi 1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6

S. Y. Huang, S. F. Lee, J. C. Huang, G. H. Hwang, Y. D. Yao

Research output: Contribution to journalArticle

Abstract

We report here the resistance of Co Nbx Ti1-x multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of CoNbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed.

Original languageEnglish
Article number10B103
JournalJournal of Applied Physics
Volume97
Issue number10
DOIs
Publication statusPublished - 2005 May 15

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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