@article{99074c17fddc4cbba7d025638869641a,
title = "Perpendicular magnetization of epitaxial CrPt x films",
abstract = "Perpendicular magnetization and Kerr effects of epitaxial CrPtx films have been studied as functions of the crystal orientation, alloy composition, and growth temperature. The orientation dependence studies reveal that only the (111)-oriented CrPtx films possess perpendicular magnetization, while the (311) and (100) films are magnetized in plane. The composition and temperature dependencies show that the CrPtx films possess optimal perpendicular magnetization and Kerr effect at x∼3 and growth temperature ∼850±25 °C. Anisotropic ordering parameter along the (nearly) in-plane and plane-normal directions was observed. The optimal composition and temperature conditions are accompanied by the highest plane-normal L 12 ordering parameter.",
author = "Hu, {Y. M.} and Huang, {J. C.A.} and Chen, {C. W.} and Lee, {C. H.} and Lin, {M. J.}",
note = "Funding Information: We are grateful for the financial support by the National Science Council under Grant No. 92-2112-M-390-001. Table I. XRD structural parameters of 500-{\AA}-thick CrPt 3 ( 111 ) temperature-wedge samples grown on Al 2 O 3 ( 0001 ) substrate. d 111 , spacing of (111) planes (close to 2.238 {\AA} of bulk L 1 2 CrPt 3 ); S ⊥ and S ‖ , chemical order parameters along the plane-normal and (near) in-plane directions; Δ 2 θ ± 112 and Δ 2 θ ± 113 , full widths at half maximum of the ( ± 113 ) and ( ± 112 ) peaks in a θ - 2 θ scan; Δ θ ± 112 and Δ θ ± 113 , full widths at half maximum of the ( ± 113 ) and ( ± 112 ) peaks in a rocking curve scan. Temp. (°C) d 111 ( {\AA} ) S ⊥ S ‖ Δ 2 θ 112 ( deg ) Δ θ 112 ( deg ) Δ 2 θ 113 ( deg ) Δ θ 113 ( deg ) Δ 2 θ − 112 ( deg ) Δ θ − 112 ( deg ) Δ 2 θ − 113 ( deg ) Δ θ − 113 ( deg ) 605 2.237 0.433 ⋯ 0.303 0.273 0.234 0.159 ⋯ ⋯ ⋯ ⋯ 630 2.236 0.428 0.294 0.263 0.193 0.216 0.144 0.212 0.232 0.196 0.155 665 2.237 0.459 0.373 0.256 0.211 0.236 0.223 0.2123 0.216 0.206 0.159 710 2.230 0.446 0.359 0.498 0.368 0.640 0.25 0.295 0.286 0.502 0.269 760 2.233 0.514 0.460 0.289 0.186 0.456 0.179 0.246 0.199 0.405 0.183 800 2.227 0.58 0.436 0.464 0.245 0.465 0.217 0.37 0.295 0.539 0.241 850 2.234 0.669 0.445 0.249 0.118 0.355 0.09 0.182 0.145 0.245 0.102 880 2.232 0.640 0.572 0.391 0.401 0.362 0.168 0.261 0.145 0.394 0.149 FIG. 1. Schematic diagrams showing (a) the CrPt x thickness wedge grown by Cr ∕ Pt ∕ Cr trilayer (at a high temperature of 850 °C) and (b) the temperature-wedge sample holder. The angle θ is out of the plane of the holder. FIG. 2. Lattice parameters of the CrPt x ( 111 ) films determined by θ - 2 θ XRD scans in this work (solid squares) and by Waterstrat (empty circles, see Ref. 14 ). A linear fit of our data gives us the chromium composition. FIG. 3. PMOKE hysteresis loops scanned from 500-{\AA}-thick CrPt 3 films simultaneously grown on Al 2 O 3 ( 0001 ) , Al 2 O 3 ( 11 - 20 ) , Al 2 O 3 ( 1 - 100 ) , and MgO (100) substrates at 850 °C. FIG. 4. (a) PMOKE hysteresis loops scanned from CrPt x ( 111 ) thickness-wedge samples grown on Al 2 O 3 ( 0001 ) substrate at 850 °C. (b) The corresponding Kerr rotation and loop squareness as a function of alloy composition x . The lines in (b) are guides for the eyes. FIG. 5. (a) PMOKE hysteresis loops scanned from CrPt 3 ( 111 ) temperature-wedge samples grown on Al 2 O 3 ( 0001 ) substrate. (b) The corresponding Kerr rotation and loop squareness as a function of growth temperature T g . The lines in (b) are guides for the eyes. FIG. 6. Order parameter of the CrPt 3 ( 111 ) films as a function of growth temperature T g . ",
year = "2005",
month = jul,
day = "1",
doi = "10.1063/1.1929862",
language = "English",
volume = "98",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "1",
}