TY - JOUR
T1 - Phase-strain model for polarimetric strain sensors based on fictitious residual strains
AU - Lo, Y. L.
AU - Nielsen, P. L.
AU - Sirkis, J. S.
N1 - Funding Information:
This work was partially supported by the Army Research Office Grant # DAAL 03-92-G-0121 (Dr. Gary Anderson; Technical Monitor), Lockheed Aeronautical System Company (Duane Szalwinski, Technical Monitor), and the National Science Foundation under Grant # BCS-9202159. This support is gratefully acknowledged.
Funding Information:
This work was partially supported by the Army Research Office Grant # DAAL 03-92-G-0121 (Dr. Gary Anderson; Technical Monitor), Lockheed Aeronautical System Company (Duane Szalwinski, Technical Monitor), and the National Science Foundation under Grant * BCS-9202159. This support is gratefully acknowledged.
Publisher Copyright:
© 1994 SPIE. All rights reserved.
PY - 1994/5/1
Y1 - 1994/5/1
N2 - The development of a phenomenologically based phase-strain model for structurally embedded polarimetric sensors is presented and then applied to Bow-Tie and e-core high-birefringence optical fibers and standard circular core low-birefringence optical fiber. This phase-strain model is developed by postulating the existence of a fictitious residual strain state in the optical fiber core, and then following standard model development techniques. Calibration procedures are used to determine all parameters required by this model.
AB - The development of a phenomenologically based phase-strain model for structurally embedded polarimetric sensors is presented and then applied to Bow-Tie and e-core high-birefringence optical fibers and standard circular core low-birefringence optical fiber. This phase-strain model is developed by postulating the existence of a fictitious residual strain state in the optical fiber core, and then following standard model development techniques. Calibration procedures are used to determine all parameters required by this model.
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U2 - 10.1117/12.173978
DO - 10.1117/12.173978
M3 - Conference article
AN - SCOPUS:85076690433
SN - 0277-786X
VL - 2191
SP - 468
EP - 474
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation
Y2 - 13 February 1994 through 18 February 1994
ER -