Physical and structural properties of RF magnetron sputtered ZnO films

Ren Chuan Chang, Sheng Vuan Chu, Kuang Yao Lo, Shih Chieh Lo, Yi Ren Huang

Research output: Contribution to journalConference articlepeer-review

9 Citations (Scopus)

Abstract

Poly-crystal zinc oxide thin films with c-axis orientation have been successfully grown on the silicon substrate by r.f. magnetron sputtering technique. A systematic study has been made of the influence of substrate temperature on the film structural and optical properties. For SAW device applications, it is necessary for ZnO films to have c-axis oriented crystalline structure. Much lower FWHM values 0.24° is obtained under the substrate temperature at 100°C for gaining effective electromechanical coupling. Crystalline structures, stress, and surface morphology characteristics of the films were investigated by X-ray diffraction, scanning electron microscopy. Reflective Second Harmonic Generation was used to analyze the quality of the ZnO film, and the results from these ZnO films coincide with the X-ray pattern and SEM image. Optical transmittance measurements were carried out by UV-visible spectrophotometer.

Original languageEnglish
Pages (from-to)43-53
Number of pages11
JournalIntegrated Ferroelectrics
Volume69
DOIs
Publication statusPublished - 2005
Event16th International Symposium on Integrated Ferroelectrics, ISIF-16 - Gyeongju, Korea, Republic of
Duration: 2004 Apr 52004 Apr 8

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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