Physical parameters extraction from current-voltage characteristic for diodes using multiple nonlinear regression analysis

Chien Chih Liu; Chih Yen Chen; Chi Yuan Weng; Chien Chun Wang; Feng Lin Jenq; Po Jen Cheng; Yeong Her Wang; Mau Phon Houng

doi:10.1016/j.sse.2007.12.010

Physical parameters extraction from current-voltage characteristic for diodes using multiple nonlinear regression analysis

Chien Chih Liu, Chih Yen Chen, Chi Yuan Weng, Chien Chun Wang, Feng Lin Jenq, Po Jen Cheng, Yeong Her Wang, Mau Phon Houng

Research output: Contribution to journal › Letter › peer-review

30 Citations (Scopus)

Abstract

In this work, the two-step iteration combined with the nonlinear multiple regression technique to extract physical parameters for diodes, using a simple physical-based current-voltage (I-V) model is demonstrated. This statistical method can be applied for sampling for a wide variety of diodes including light-emitting diodes (LEDs) and Schottky diodes. Our results show the technique is an accurate and systematic approach for extracting diode parameters. The calculated recombination currents indicate the recombination efficiency for LEDs and the quality for Schottky diodes.

Original language	English
Pages (from-to)	839-843
Number of pages	5
Journal	Solid-State Electronics
Volume	52
Issue number	6
DOIs	https://doi.org/10.1016/j.sse.2007.12.010
Publication status	Published - 2008 Jun

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Materials Chemistry
Electrical and Electronic Engineering

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10.1016/j.sse.2007.12.010

Cite this

@article{c98704a7663b4fb3aa4733dcaafb8552,

title = "Physical parameters extraction from current-voltage characteristic for diodes using multiple nonlinear regression analysis",

abstract = "In this work, the two-step iteration combined with the nonlinear multiple regression technique to extract physical parameters for diodes, using a simple physical-based current-voltage (I-V) model is demonstrated. This statistical method can be applied for sampling for a wide variety of diodes including light-emitting diodes (LEDs) and Schottky diodes. Our results show the technique is an accurate and systematic approach for extracting diode parameters. The calculated recombination currents indicate the recombination efficiency for LEDs and the quality for Schottky diodes.",

author = "Liu, {Chien Chih} and Chen, {Chih Yen} and Weng, {Chi Yuan} and Wang, {Chien Chun} and Jenq, {Feng Lin} and Cheng, {Po Jen} and Wang, {Yeong Her} and Houng, {Mau Phon}",

note = "Funding Information: This work was supported by National Science Council under contract number NSC-96-2221-E-006-082-MY2 and NSC-96-2221-E-232-001-.",

year = "2008",

month = jun,

doi = "10.1016/j.sse.2007.12.010",

language = "English",

volume = "52",

pages = "839--843",

journal = "Solid-State Electronics",

issn = "0038-1101",

publisher = "Elsevier Limited",

number = "6",

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TY - JOUR

T1 - Physical parameters extraction from current-voltage characteristic for diodes using multiple nonlinear regression analysis

AU - Liu, Chien Chih

AU - Chen, Chih Yen

AU - Weng, Chi Yuan

AU - Wang, Chien Chun

AU - Jenq, Feng Lin

AU - Cheng, Po Jen

AU - Wang, Yeong Her

AU - Houng, Mau Phon

N1 - Funding Information: This work was supported by National Science Council under contract number NSC-96-2221-E-006-082-MY2 and NSC-96-2221-E-232-001-.

PY - 2008/6

Y1 - 2008/6

N2 - In this work, the two-step iteration combined with the nonlinear multiple regression technique to extract physical parameters for diodes, using a simple physical-based current-voltage (I-V) model is demonstrated. This statistical method can be applied for sampling for a wide variety of diodes including light-emitting diodes (LEDs) and Schottky diodes. Our results show the technique is an accurate and systematic approach for extracting diode parameters. The calculated recombination currents indicate the recombination efficiency for LEDs and the quality for Schottky diodes.

AB - In this work, the two-step iteration combined with the nonlinear multiple regression technique to extract physical parameters for diodes, using a simple physical-based current-voltage (I-V) model is demonstrated. This statistical method can be applied for sampling for a wide variety of diodes including light-emitting diodes (LEDs) and Schottky diodes. Our results show the technique is an accurate and systematic approach for extracting diode parameters. The calculated recombination currents indicate the recombination efficiency for LEDs and the quality for Schottky diodes.

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DO - 10.1016/j.sse.2007.12.010

M3 - Letter

AN - SCOPUS:42749097823

SN - 0038-1101

VL - 52

SP - 839

EP - 843

JO - Solid-State Electronics

JF - Solid-State Electronics

IS - 6

ER -

Physical parameters extraction from current-voltage characteristic for diodes using multiple nonlinear regression analysis

Abstract

All Science Journal Classification (ASJC) codes

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