Physical parameters extraction from current-voltage characteristic for diodes using multiple nonlinear regression analysis

Chien Chih Liu, Chih Yen Chen, Chi Yuan Weng, Chien Chun Wang, Feng Lin Jenq, Po Jen Cheng, Yeong Her Wang, Mau Phon Houng

Research output: Contribution to journalLetter

20 Citations (Scopus)

Abstract

In this work, the two-step iteration combined with the nonlinear multiple regression technique to extract physical parameters for diodes, using a simple physical-based current-voltage (I-V) model is demonstrated. This statistical method can be applied for sampling for a wide variety of diodes including light-emitting diodes (LEDs) and Schottky diodes. Our results show the technique is an accurate and systematic approach for extracting diode parameters. The calculated recombination currents indicate the recombination efficiency for LEDs and the quality for Schottky diodes.

Original languageEnglish
Pages (from-to)839-843
Number of pages5
JournalSolid-State Electronics
Volume52
Issue number6
DOIs
Publication statusPublished - 2008 Jun 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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