Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film

C. H. Hsieh, Y. S. Huang, K. K. Tiong, C. W. Fan, Y. F. Chen, L. C. Chen, J. J. Wu, K. H. Chen

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A detailed piezoreflectance (PzR) study of an Fe-containing silicon carbon nitride crystalline film in the temperature range between 15 and 580 K was performed. From the line shape fit of the PzR spectra, the impurity to band and the direct band-to-band transition energies which are denoted as Ei and Edg, respectively, at various temperatures were accurately determined. The parameters that describe the temperature dependence of Ei and Edg are evaluated and discussed.

Original languageEnglish
Pages (from-to)280-284
Number of pages5
JournalJournal of Applied Physics
Volume87
Issue number1
DOIs
Publication statusPublished - 2000 Jan 1

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film'. Together they form a unique fingerprint.

  • Cite this

    Hsieh, C. H., Huang, Y. S., Tiong, K. K., Fan, C. W., Chen, Y. F., Chen, L. C., Wu, J. J., & Chen, K. H. (2000). Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film. Journal of Applied Physics, 87(1), 280-284. https://doi.org/10.1063/1.371856