Piezoreflectance study of silicon carbon nitride nanorods

C. H. Hsieh, Y. S. Huang, P. F. Kuo, Y. F. Chen, L. C. Chen, J. J. Wu, K. H. Chen, K. K. Tiong

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)


Detailed piezoreflectance (PzR) measurements of quasialigned silicon carbon nitride nanorods in the temperature range between 15 and 400 K were performed. The direct band-to-band transition energies Edg at various temperatures were determined accurately through line shape fit of the experimental PzR spectra. The temperature dependence of Edg is analyzed by the Varshni equation [Y. P. Varshni, Physica, (Amsterdam) 34, 149 (1967)] and an expression containing the Bose-Einstein occupation factor for phonons proposed by L. Viña, S. Logothetidis, and M. Cardona [Phys. Rev. B 30, 1979 (1984)]. The parameters that describe the temperature dependence of Edg are evaluated and discussed.

Original languageEnglish
Pages (from-to)2044-2046
Number of pages3
JournalApplied Physics Letters
Issue number15
Publication statusPublished - 2000 Apr 10

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


Dive into the research topics of 'Piezoreflectance study of silicon carbon nitride nanorods'. Together they form a unique fingerprint.

Cite this