Polarimetric detection to examine the residual AM-effect in the waveguide E-O phase modulator

Ton Ko, Chen Hsing Chao, Pai Sheng Shen, Ching Ting Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The unwanted amplitude modulation (AM) content in the output of a waveguide E-O phase modulator has been observed. The residual AM effect is mostly due to both misalignment of the input and output polarization couplings of the waveguide. The polarimetric detection method introduces a simple method of alignment correction.

Original languageEnglish
Title of host publicationOptics in Complex Systems
EditorsF. Lanzl, H.-J. Preuss, G. Weigelt
PublisherPubl by Int Soc for Optical Engineering
Number of pages1
ISBN (Print)0819403806
Publication statusPublished - 1990 Dec 1
Event15th Congress of the International Commission for Optics - Garmisch-Partenkirchen, Germany
Duration: 1990 Aug 51990 Aug 10

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1319
ISSN (Print)0277-786X

Other

Other15th Congress of the International Commission for Optics
CityGarmisch-Partenkirchen, Germany
Period90-08-0590-08-10

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Ko, T., Chao, C. H., Shen, P. S., & Lee, C. T. (1990). Polarimetric detection to examine the residual AM-effect in the waveguide E-O phase modulator. In F. Lanzl, H-J. Preuss, & G. Weigelt (Eds.), Optics in Complex Systems (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1319). Publ by Int Soc for Optical Engineering.