Polarimetric detection to examine the residual am-effect in the waveguide E-O phase modulator

Ton Ko; Chen Hsing Chao; Pai Sheng Shew; Ching Ting Lee

doi:10.1117/12.22231

Polarimetric detection to examine the residual am-effect in the waveguide E-O phase modulator

Ton Ko, Chen Hsing Chao, Pai Sheng Shew, Ching Ting Lee

Department of Photonics

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	120
Number of pages	1
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1319
DOIs	https://doi.org/10.1117/12.22231
Publication status	Published - 1990
Event	15th International Optics in Complex Systems 1990 - Garmisch, Germany Duration: 1990 Aug 5 → …

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.22231

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@article{22351a2462f24ea3a5794984307b7c12,

title = "Polarimetric detection to examine the residual am-effect in the waveguide E-O phase modulator",

author = "Ton Ko and Chao, {Chen Hsing} and Shew, {Pai Sheng} and Lee, {Ching Ting}",

year = "1990",

doi = "10.1117/12.22231",

language = "English",

volume = "1319",

pages = "120",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

}

TY - JOUR

T1 - Polarimetric detection to examine the residual am-effect in the waveguide E-O phase modulator

AU - Ko, Ton

AU - Chao, Chen Hsing

AU - Shew, Pai Sheng

AU - Lee, Ching Ting

PY - 1990

Y1 - 1990

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U2 - 10.1117/12.22231

DO - 10.1117/12.22231

M3 - Conference article

AN - SCOPUS:0025623830

VL - 1319

SP - 120

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

T2 - 15th International Optics in Complex Systems 1990

Y2 - 5 August 1990

ER -

Polarimetric detection to examine the residual am-effect in the waveguide E-O phase modulator

All Science Journal Classification (ASJC) codes

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