Polarization-resolved fine-structure splitting of zero-dimensional In xGa1-xN excitons

S. Amloy, Y. T. Chen, K. F. Karlsson, K. H. Chen, H. C. Hsu, C. L. Hsiao, L. C. Chen, P. O. Holtz

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Abstract

The fine-structure splitting of quantum confined InxGa 1-xN excitons is investigated using polarization-sensitive photoluminescence spectroscopy. The majority of the studied emission lines exhibits mutually orthogonal fine-structure components split by 100-340 μeV, as measured from the cleaved edge of the sample. The exciton and the biexciton reveal identical magnitudes but reversed sign of the energy splitting.

Original languageEnglish
Article number201307
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume83
Issue number20
DOIs
Publication statusPublished - 2011 May 18

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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