The fine-structure splitting of quantum confined InxGa 1-xN excitons is investigated using polarization-sensitive photoluminescence spectroscopy. The majority of the studied emission lines exhibits mutually orthogonal fine-structure components split by 100-340 μeV, as measured from the cleaved edge of the sample. The exciton and the biexciton reveal identical magnitudes but reversed sign of the energy splitting.
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2011 May 18|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics