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Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations
Fong Jyun Tsai, Chong Siao Ye, Kuen Jong Lee, Shi Xuan Zheng, Yu Huang, Wu Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
4
Citations
(Scopus)