Pressure and temperature dependence of the critical current density in YBa2Cu3O7-δ thin films

S. L. Bud'ko, M. F. Davis, J. C. Wolfe, C. W. Chu, P. H. Hor

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16 Citations (Scopus)

Abstract

The transport critical current density (Jc) in c-oriented Y-Ba-Cu-O thin films deposited on LaAlO3 was measured under hydrostatic pressure. We find the relative change of Jc under pressure substantially temperature dependent near Tc, and practically temperature independent for T/Tc<0.8. This behavior is discussed in terms of the empirical equation Jc=Jc0(1-T/Tc*)α, with different factors considered to be important in two temperature regions. The change of Jc under pressure for temperatures close to Tc is dominated by the value of α and pressure derivatives of Tc* and α and the pressure derivatives d(lnJc)/dP are sample dependent; for low temperatures the change of Jc is dominated mainly by pressure dependence of Jc0 and is universal for all samples under study.

Original languageEnglish
Pages (from-to)2835-2839
Number of pages5
JournalPhysical Review B
Volume47
Issue number5
DOIs
Publication statusPublished - 1993

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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