Proceedings of the Asian Test Symposium: Foreword

Kuen Jong Lee; Shi Yu Huang; Chau Chin Su; Ming Der Shieh

doi:10.1109/ATS.2004.45

Proceedings of the Asian Test Symposium: Foreword

Kuen Jong Lee, Shi Yu Huang, Chau Chin Su, Ming Der Shieh

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings of the Asian Test Symposium, ATS'04
Pages	xi
DOIs	https://doi.org/10.1109/ATS.2004.45
Publication status	Published - 2004 Dec 1
Event	Proceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan Duration: 2004 Nov 15 → 2004 Nov 17

Publication series

Name	Proceedings of the Asian Test Symposium
ISSN (Print)	1081-7735

Other

Other	Proceedings of the Asian Test Symposium, ATS'04
Country	Taiwan
City	Kenting
Period	04-11-15 → 04-11-17

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/ATS.2004.45

Cite this

@inproceedings{f995d54d17ac428f8d3d3ee5715c6487,

title = "Proceedings of the Asian Test Symposium: Foreword",

author = "Lee, {Kuen Jong} and Huang, {Shi Yu} and Su, {Chau Chin} and Shieh, {Ming Der}",

year = "2004",

month = dec,

day = "1",

doi = "10.1109/ATS.2004.45",

language = "English",

isbn = "0769522351",

series = "Proceedings of the Asian Test Symposium",

pages = "xi",

booktitle = "Proceedings of the Asian Test Symposium, ATS'04",

note = "Proceedings of the Asian Test Symposium, ATS'04 ; Conference date: 15-11-2004 Through 17-11-2004",

}

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BT - Proceedings of the Asian Test Symposium, ATS'04

Y2 - 15 November 2004 through 17 November 2004

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