Proceedings of the Asian Test Symposium: Foreword

Kuen Jong Lee, Shi Yu Huang, Chau Chin Su, Ming Der Shieh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the Asian Test Symposium, ATS'04
Pagesxi
DOIs
Publication statusPublished - 2004 Dec 1
EventProceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan
Duration: 2004 Nov 152004 Nov 17

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Other

OtherProceedings of the Asian Test Symposium, ATS'04
CountryTaiwan
CityKenting
Period04-11-1504-11-17

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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