Proceedings of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword

Rochit Rajsuman, Cheng Wen Wu, Shi Yu Huang

Research output: Contribution to journalEditorialpeer-review

Original languageEnglish
Article number1654562
Pages (from-to)8
Number of pages1
JournalRecords of the IEEE International Workshop on Memory Technology, Design and Testing
Volume2006
DOIs
Publication statusPublished - 2006 Dec 1
Event2006 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT'06 - Taipei, Taiwan
Duration: 2006 Aug 22006 Aug 4

All Science Journal Classification (ASJC) codes

  • Media Technology

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