Proceedings of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword

Rochit Rajsuman, Cheng Wen Wu, Shi Yu Huang

Research output: Contribution to journalEditorial

Original languageEnglish
Article number1654562
JournalRecords of the IEEE International Workshop on Memory Technology, Design and Testing
Volume2006
DOIs
Publication statusPublished - 2006 Dec 1
Event2006 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT'06 - Taipei, Taiwan
Duration: 2006 Aug 22006 Aug 4

All Science Journal Classification (ASJC) codes

  • Media Technology

Cite this

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title = "Proceedings of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword",
author = "Rochit Rajsuman and Wu, {Cheng Wen} and Huang, {Shi Yu}",
year = "2006",
month = "12",
day = "1",
doi = "10.1109/MTDT.2006.15",
language = "English",
volume = "2006",
journal = "Records of the IEEE International Workshop on Memory Technology, Design and Testing",
issn = "1087-4852",
publisher = "IEEE Computer Society",

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AU - Wu, Cheng Wen

AU - Huang, Shi Yu

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DO - 10.1109/MTDT.2006.15

M3 - Editorial

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JO - Records of the IEEE International Workshop on Memory Technology, Design and Testing

JF - Records of the IEEE International Workshop on Memory Technology, Design and Testing

SN - 1087-4852

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