TY - JOUR
T1 - Promotion of self-assembly patterning of fept nanoparticles by tuning the concentration of oleylamine/oleic acid surfactants in a coating solution
AU - Fujihira, Yoshiki
AU - Hachisu, Takuma
AU - Shitanda, Suguru
AU - Aikawa, Kenichiro
AU - Sugiyama, Atsushi
AU - Mizuno, Jun
AU - Shoji, Shuichi
AU - Asahi, Toru
AU - Osaka, Tetsuya
N1 - Publisher Copyright:
© 2016 The Electrochemical Society.
PY - 2016
Y1 - 2016
N2 - To provide a bit-patterned perpendicular magnetic recording medium consisting of an array of FePt magnetic nanoparticles, the effect of the total dispersant concentrations of oleylamine and oleic acid in a FePt-nanoparticle/toluene coating solution on a self-assembled nanoparticle array with a long-range periodicity on a flat SiO2/Si substrate and two patterned substrates, respectively, was examined. At a surfactant concentration greater than 0.8 vol%, FePt nanoparticles with an average size of 4.4 nm were arrayed in a two-dimensional and hexagonal-close-packed ordered array with 8.3-nm pitches on the flat surface. Self-assembled nanoparticles were arrayed on the bottom surface of the patterned trench, the array exhibited a hexagonal-close-packed structure. Furthermore the line defects in the arrays are caused by the waviness of the trench walls, and the surface roughness.
AB - To provide a bit-patterned perpendicular magnetic recording medium consisting of an array of FePt magnetic nanoparticles, the effect of the total dispersant concentrations of oleylamine and oleic acid in a FePt-nanoparticle/toluene coating solution on a self-assembled nanoparticle array with a long-range periodicity on a flat SiO2/Si substrate and two patterned substrates, respectively, was examined. At a surfactant concentration greater than 0.8 vol%, FePt nanoparticles with an average size of 4.4 nm were arrayed in a two-dimensional and hexagonal-close-packed ordered array with 8.3-nm pitches on the flat surface. Self-assembled nanoparticles were arrayed on the bottom surface of the patterned trench, the array exhibited a hexagonal-close-packed structure. Furthermore the line defects in the arrays are caused by the waviness of the trench walls, and the surface roughness.
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U2 - 10.1149/2.0581605jes
DO - 10.1149/2.0581605jes
M3 - Article
AN - SCOPUS:85049094186
SN - 0013-4651
VL - 163
SP - D171-D174
JO - Journal of the Electrochemical Society
JF - Journal of the Electrochemical Society
IS - 5
ER -