PVT Insensitive High-Resolution Time to Digital Converter for Intraocular Pressure Sensing

Hong Yi Huang, Jen Chieh Liu, Pei Ying Lee, Kun Yuan Chen, Jin Sheng Chen, Kuo Hsing Cheng, Tzuen-Hsi Huang, Ching Hsing Luo, Jin Chern Chiou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this paper, a PVT Insensitive Time to Digital Converter is proposed to provide a stable reference clock signal of a phase-locked loop. The time resolution can be independent on process, voltage, and temperature variations. In order to produce 16-phase signals, eight series of differential delay elements are utilized. Then, interpolated architecture is used to increase the reference frequency such that the time resolution of the time digital converter is improved. Furthermore, implementing a delay element in the oscillator and replica bias circuit can enhance the linearity of the KVCO. Finally, this paper proposes the use of a symmetric time-Amplify control circuit, hence, the output pulse width and input cycle time can be synchronized. As the amplification increases the resolution increases, achieving the best resolution of 4.73ps and a maximum detection time of 57.2ns. The test chip is implemented with TSMC 0.18um 1P6M process. The chip area is 0.77×0.32mm2 and the power consumption is 120mW.

Original languageEnglish
Title of host publicationProceedings - 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015
EditorsHeinrich Theodor Vierhaus, Zoran Stamenkovic, Witold Pleskacz, Jaan Raik
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages125-128
Number of pages4
ISBN (Electronic)9781479967803
DOIs
Publication statusPublished - 2015 Aug 13
Event18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015 - Belgrade, Serbia
Duration: 2015 Apr 222015 Apr 24

Publication series

NameProceedings - 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015

Other

Other18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015
CountrySerbia
CityBelgrade
Period15-04-2215-04-24

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

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