Quality improvement in cleaning process for TFT-LCD production

Chin E. Lin; Chun Mu Lin

doi:10.6125/14-0307-785

Quality improvement in cleaning process for TFT-LCD production

Chin E. Lin, Chun Mu Lin

Research output: Contribution to journal › Article › peer-review

Abstract

Thin Film Transistor Liquid Crystal Display (TFT-LCD) production pastes the polarizer onto glass panel using paste roller. TFT-LCD quality is affected by some inefficient cleaning work in polarizer pasting process to cause panel deface and leave residual glue behind in light leak. The clean processing becomes the key in quality assurance of TFT-LCD production. This paper adopts the Taguchi Experiment Method in experiment design and test to improve the G8.5 42 TFT-LCD production quality control. The affecting parameters concerning brush direction, speed, nip and conveyer speed are considered into the orthogonal array for experiments to find the best control adjustment. The objective of this study investigates the quality assurance in automatic TFT production. From production line tests, the production yield accomplishes 0.06% improvement of residual variation from 0.19% to 0.13%. It is significant improvement in TFT-LCD mass production.

Original language	English
Pages (from-to)	249-260
Number of pages	12
Journal	Journal of Aeronautics, Astronautics and Aviation
Volume	46
Issue number	4
DOIs	https://doi.org/10.6125/14-0307-785
Publication status	Published - 2014 Dec 1

All Science Journal Classification (ASJC) codes

Aerospace Engineering
Space and Planetary Science

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title = "Quality improvement in cleaning process for TFT-LCD production",

abstract = "Thin Film Transistor Liquid Crystal Display (TFT-LCD) production pastes the polarizer onto glass panel using paste roller. TFT-LCD quality is affected by some inefficient cleaning work in polarizer pasting process to cause panel deface and leave residual glue behind in light leak. The clean processing becomes the key in quality assurance of TFT-LCD production. This paper adopts the Taguchi Experiment Method in experiment design and test to improve the G8.5 42 TFT-LCD production quality control. The affecting parameters concerning brush direction, speed, nip and conveyer speed are considered into the orthogonal array for experiments to find the best control adjustment. The objective of this study investigates the quality assurance in automatic TFT production. From production line tests, the production yield accomplishes 0.06% improvement of residual variation from 0.19% to 0.13%. It is significant improvement in TFT-LCD mass production.",

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AU - Lin, Chun Mu

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AB - Thin Film Transistor Liquid Crystal Display (TFT-LCD) production pastes the polarizer onto glass panel using paste roller. TFT-LCD quality is affected by some inefficient cleaning work in polarizer pasting process to cause panel deface and leave residual glue behind in light leak. The clean processing becomes the key in quality assurance of TFT-LCD production. This paper adopts the Taguchi Experiment Method in experiment design and test to improve the G8.5 42 TFT-LCD production quality control. The affecting parameters concerning brush direction, speed, nip and conveyer speed are considered into the orthogonal array for experiments to find the best control adjustment. The objective of this study investigates the quality assurance in automatic TFT production. From production line tests, the production yield accomplishes 0.06% improvement of residual variation from 0.19% to 0.13%. It is significant improvement in TFT-LCD mass production.

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Quality improvement in cleaning process for TFT-LCD production

Abstract

All Science Journal Classification (ASJC) codes

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