Quality, Reliability and Statistics in Nano-Technology

J.-C. Lu, Shuen-Lin Jeng, S. C. Lin, Ni Wang, M. K. Jeong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationThe International Federation of Operational Research Societies
Place of PublicationHonolulu, Hawaii
Publication statusPublished - 2005 Jul 11

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