Quantitative assessment of slit Mura defect in a thin film transistor-liquid crystal display based on chromaticity and optical density

Fu Ming Tzu, Jung Hua Chou

Research output: Contribution to journalArticlepeer-review

Abstract

An innovative non-contact optical inspection method is developed to quantify slit Mura defects for thin film transistor-liquid crystal displays (TFT-LCDs). From the measurements of both chromaticity and optical densities across the slit Mura, the results indicate that the optical density profile is a concave shape and the chromaticity distribution is a convex shape. A linear relation with a negative slope exists between the chromaticity and optical density. A larger colour difference has a steeper slope, and vice versa. All of the measurements with uncertainties of a 99.7% confidence interval satisfy the requirements of the flat panel display industry. The proposed method can accurately quantify the pattern of blue slit Mura of TFT-LCDs; even the perceptibility is below the just noticeable difference.

Original languageEnglish
Article number115108
JournalMeasurement Science and Technology
Volume21
Issue number11
DOIs
Publication statusPublished - 2010 Nov

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Engineering (miscellaneous)
  • Applied Mathematics

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