Quantitative assessment of slit Mura defect in thin film transistor-liquid crystal display based on chromaticity and density optical

Fu Ming Tzu, Jung Hua Chou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we propose a creative non-contact automatic optical inspection (AOI) method for slit Mura measurements using a spectrometer and a photomultiplier tube (PMT). The experimental results indicate significant breakthrough of uniformity detection than typical macro CCD-based sensors and naked eyes, even the color difference is below the Just Noticeable Difference (JND) level. The characteristic of optical density (OD) is tended to be a concave curve; by contrast to chromaticity profile which shows a convex feature. Using the feature of chromaticity or optical density profiles across a slit Mura, the color difference from 0.12% to 2.71% in CIEy can be measured accurately. OD difference from 0.01 to 1.11 can be detected as well. Among of the samples, the most significant change is the 2.71% of CIEy chromatic variation versus a 1.1 OD difference along the slit Mura which is explored to quantity the JND's perceptibility. A higher chromaticity corresponds to a higher transmittance and a lower optical density, and can be deduced accurately by the present method.

Original languageEnglish
Title of host publicationIMPACT Conference 2009 International 3D IC Conference - Proceedings
Pages373-376
Number of pages4
DOIs
Publication statusPublished - 2009 Dec 1
EventIMPACT Conference 2009 International 3D IC Conference - Taipei, Taiwan
Duration: 2009 Oct 212009 Oct 23

Publication series

NameIMPACT Conference 2009 International 3D IC Conference - Proceedings

Other

OtherIMPACT Conference 2009 International 3D IC Conference
CountryTaiwan
CityTaipei
Period09-10-2109-10-23

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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    Tzu, F. M., & Chou, J. H. (2009). Quantitative assessment of slit Mura defect in thin film transistor-liquid crystal display based on chromaticity and density optical. In IMPACT Conference 2009 International 3D IC Conference - Proceedings (pp. 373-376). [5382196] (IMPACT Conference 2009 International 3D IC Conference - Proceedings). https://doi.org/10.1109/IMPACT.2009.5382196