Quantitative scanning evanescent microwave microscopy and its applications in characterization of functional materials libraries

Chen Gao; Bo Hu; I. Takeuchi; Kao Shuo Chang; Xiao Dong Xiang; Gang Wang

doi:10.1088/0957-0233/16/1/033

Quantitative scanning evanescent microwave microscopy and its applications in characterization of functional materials libraries

Chen Gao
, Bo Hu
, I. Takeuchi
, Kao Shuo Chang
, Xiao Dong Xiang
, Gang Wang

Department of Materials Science and Engineering

Research output: Contribution to journal › Review article › peer-review

73 Citations (Scopus)

Abstract

This paper gives a comprehensive review on the advances in the field of scanning evanescent microwave microscopy, as a high-throughput characterization tool for electrical properties. Theoretical model analyses used for performing quantitative non-destructive characterization of various materials are presented. Examples of applications of the microwave microscopy to the rapid measurements of dielectric/ferroelectric libraries are given.

Original language	English
Pages (from-to)	248-260
Number of pages	13
Journal	Measurement Science and Technology
Volume	16
Issue number	1
DOIs	https://doi.org/10.1088/0957-0233/16/1/033
Publication status	Published - 2005 Jan

All Science Journal Classification (ASJC) codes

Instrumentation
Engineering (miscellaneous)
Applied Mathematics

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10.1088/0957-0233/16/1/033

Cite this

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abstract = "This paper gives a comprehensive review on the advances in the field of scanning evanescent microwave microscopy, as a high-throughput characterization tool for electrical properties. Theoretical model analyses used for performing quantitative non-destructive characterization of various materials are presented. Examples of applications of the microwave microscopy to the rapid measurements of dielectric/ferroelectric libraries are given.",

author = "Chen Gao and Bo Hu and I. Takeuchi and Chang, \{Kao Shuo\} and Xiang, \{Xiao Dong\} and Gang Wang",

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AU - Wang, Gang

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AB - This paper gives a comprehensive review on the advances in the field of scanning evanescent microwave microscopy, as a high-throughput characterization tool for electrical properties. Theoretical model analyses used for performing quantitative non-destructive characterization of various materials are presented. Examples of applications of the microwave microscopy to the rapid measurements of dielectric/ferroelectric libraries are given.

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M3 - Review article

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JO - Measurement Science and Technology

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Quantitative scanning evanescent microwave microscopy and its applications in characterization of functional materials libraries

Abstract

All Science Journal Classification (ASJC) codes

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