RAMSES: A fast memory fault simulator

Chi Feng Wu, Chih Tsun Huang, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some well-known memory fault models, the algorithm that we developed ensures that new fault models can be included easily by adding new fault descriptors instead of modifying the algorithm or program. With RAMSES, the time complexity of memory fault simulation is improved from O(N3) to O(N2), where N is the memory capacity in terns of bits. Our approach requires only a small amount of extra memory space. Simulation results by RAMSES show that running the proposed cocktail-March tests can significantly reduce the test time. With the help of RAMSES, an efficient test algorithm called March-CW was developed for word-oriented memories.

Original languageEnglish
Title of host publicationProceedings - 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1999
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages165-173
Number of pages9
ISBN (Electronic)076950325X, 9780769503257
DOIs
Publication statusPublished - 1999 Jan 1
Event1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1999 - Albuquerque, United States
Duration: 1999 Nov 11999 Nov 3

Publication series

NameProceedings - 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1999

Conference

Conference1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1999
CountryUnited States
CityAlbuquerque
Period99-11-0199-11-03

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Wu, C. F., Huang, C. T., & Wu, C. W. (1999). RAMSES: A fast memory fault simulator. In Proceedings - 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1999 (pp. 165-173). [802882] (Proceedings - 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1999). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DFTVS.1999.802882