RAMSES-D: DRAM fault simulator supporting weighted coupling fault

Yu Tsao Hsing, Song Guang Wu, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

Memory fault simulator is an important tool for memory test sequence optimization. Traditionally, we use fault count to calculate fault coverage. However, it cannot represent accurately the real coupling fault distribution. In this paper, we adopt the concept of weighted coupling fault targeting DRAM.We propose a weighted fault coverage function with assigning weight parameters to coupling faults. With the weighted function, we can use physical information to calculate coupling fault coverage. Experimental result shows that the weight of intra-word coupling fault can be 10% to 14%; while the original fault count method cannot distinguish the degree of importance between different memory configurations.

Original languageEnglish
Title of host publication17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007
Pages33-38
Number of pages6
DOIs
Publication statusPublished - 2007 Dec 1
Event17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 - Taipei, Taiwan
Duration: 2007 Dec 32007 Dec 5

Publication series

NameRecords of the IEEE International Workshop on Memory Technology, Design and Testing
ISSN (Print)1087-4852

Conference

Conference17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007
Country/TerritoryTaiwan
CityTaipei
Period07-12-0307-12-05

All Science Journal Classification (ASJC) codes

  • Media Technology

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