Rapid thermal annealing of chemical bath-deposited CuxS films and their characterization

Yung Tang Nien, In Gann Chen

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)


Thin films of amorphous copper sulfide (CuxS, x = 2) with a thickness of around 40 nm deposited at room temperature on glass and silicon substrates from a solution containing copper complex and thiourea, showed a homogeneous distribution of copper and sulfur, based on their elemental mapping images. Scanning electron micrographs presented Cu2S films exhibiting strong condensation after rapid thermal annealing at temperatures of >200 °C, which is believed to result from the decomposition of solvents or films. Meanwhile, the as-deposited Cu2S was found to convert to CuS at 200-300 °C by referring to the shifting of their Raman (472 cm-1 → 474 cm-1) and X-ray photoelectron spectrum (Cu 2p3/2: 932 eV → 934 eV) peaks. Optical transmission spectra also revealed the phase transformation of the as-deposited CuxS film from Cu2S to CuS at 200-300 °C.

Original languageEnglish
Pages (from-to)553-556
Number of pages4
JournalJournal of Alloys and Compounds
Issue number1-2
Publication statusPublished - 2009 Mar 5

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry


Dive into the research topics of 'Rapid thermal annealing of chemical bath-deposited Cu<sub>x</sub>S films and their characterization'. Together they form a unique fingerprint.

Cite this