Records of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword

Rochit Rajsuman, Cheng Wen Wu

Research output: Contribution to journalEditorialpeer-review

Original languageEnglish
Pages (from-to)8
Number of pages1
JournalRecords of the IEEE International Workshop on Memory Technology, Design and Testing
DOIs
Publication statusPublished - 2005 Dec 9
EventProceedings - 2005 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2005 - Taipei, Taiwan
Duration: 2005 Aug 32005 Aug 5

All Science Journal Classification (ASJC) codes

  • Media Technology

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