Records of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword

Rochit Rajsuman; Cheng Wen Wu

doi:10.1109/MTDT.2005.23

Records of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword

Rochit Rajsuman
, Cheng Wen Wu

Department of Electrical Engineering

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Pages (from-to)	8
Number of pages	1
Journal	Records of the IEEE International Workshop on Memory Technology, Design and Testing
DOIs	https://doi.org/10.1109/MTDT.2005.23
Publication status	Published - 2005 Dec 9
Event	Proceedings - 2005 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2005 - Taipei, Taiwan Duration: 2005 Aug 3 → 2005 Aug 5

All Science Journal Classification (ASJC) codes

Media Technology

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10.1109/MTDT.2005.23

Cite this

@article{af213cd108e04af29b0b2a6c4f8c568f,

title = "Records of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword",

author = "Rochit Rajsuman and Wu, \{Cheng Wen\}",

year = "2005",

month = dec,

day = "9",

doi = "10.1109/MTDT.2005.23",

language = "English",

pages = "8",

journal = "Records of the IEEE International Workshop on Memory Technology, Design and Testing",

issn = "1087-4852",

publisher = "IEEE Computer Society",

note = "Proceedings - 2005 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2005 ; Conference date: 03-08-2005 Through 05-08-2005",

}

TY - JOUR

T1 - Records of the IEEE International Workshop on Memory Technology, Design and Testing

T2 - Proceedings - 2005 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2005

AU - Rajsuman, Rochit

AU - Wu, Cheng Wen

PY - 2005/12/9

Y1 - 2005/12/9

UR - https://www.scopus.com/pages/publications/28344450719

UR - https://www.scopus.com/pages/publications/28344450719#tab=citedBy

U2 - 10.1109/MTDT.2005.23

DO - 10.1109/MTDT.2005.23

M3 - Editorial

AN - SCOPUS:28344450719

SN - 1087-4852

SP - 8

JO - Records of the IEEE International Workshop on Memory Technology, Design and Testing

JF - Records of the IEEE International Workshop on Memory Technology, Design and Testing

Y2 - 3 August 2005 through 5 August 2005

ER -

Records of the IEEE International Workshop on Memory Technology, Design and Testing: Foreword

All Science Journal Classification (ASJC) codes

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