Reducing OLED degradation using self-compensated circuit for AMOLED displays

Chih Lung Lin; Kuan Wen Chou; Chia Che Hung; Yu Cheng Chang; Kuo Chao Liao

doi:10.1109/LED.2011.2162391

Reducing OLED degradation using self-compensated circuit for AMOLED displays

Chih Lung Lin, Kuan Wen Chou, Chia Che Hung, Yu Cheng Chang, Kuo Chao Liao

Department of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

In this letter, the electric characteristics of the fabricated organic light-emitting diode (OLED) devices are analyzed after a bias stress. Experimental results demonstrate that when a constant voltage is applied to the OLED device, the OLED threshold voltage gradually increases, resulting in the driving current to decay. Therefore, a novel voltage driving scheme for active-matrix OLEDs using low-temperature polysilicon thin-film transistors (poly-Si TFTs) is proposed. This circuit uses three TFTs to increase the aperture ratio of panels and the driving current of the OLED device to ameliorate the luminance drop that is caused by OLED degradation. Simulation results indicate that the proposed pixel circuit has high immunity to V _TH variations of the poly-Si TFTs and provides an extra compensation current against OLED degradation.

Original language	English
Article number	6004806
Pages (from-to)	1403-1405
Number of pages	3
Journal	IEEE Electron Device Letters
Volume	32
Issue number	10
DOIs	https://doi.org/10.1109/LED.2011.2162391
Publication status	Published - 2011 Oct

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/LED.2011.2162391

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@article{a3c3166d208a4cd185ca168faad89ef6,

title = "Reducing OLED degradation using self-compensated circuit for AMOLED displays",

abstract = "In this letter, the electric characteristics of the fabricated organic light-emitting diode (OLED) devices are analyzed after a bias stress. Experimental results demonstrate that when a constant voltage is applied to the OLED device, the OLED threshold voltage gradually increases, resulting in the driving current to decay. Therefore, a novel voltage driving scheme for active-matrix OLEDs using low-temperature polysilicon thin-film transistors (poly-Si TFTs) is proposed. This circuit uses three TFTs to increase the aperture ratio of panels and the driving current of the OLED device to ameliorate the luminance drop that is caused by OLED degradation. Simulation results indicate that the proposed pixel circuit has high immunity to V TH variations of the poly-Si TFTs and provides an extra compensation current against OLED degradation.",

author = "Lin, {Chih Lung} and Chou, {Kuan Wen} and Hung, {Chia Che} and Chang, {Yu Cheng} and Liao, {Kuo Chao}",

note = "Funding Information: Manuscript received June 16, 2011; accepted June 29, 2011. Date of publication August 29, 2011; date of current version September 28, 2011. This work was supported in part by the Advanced Optoelectronic Technology Center, National Cheng Kung University, under projects of the Ministry of Education and in part by the National Science Council of Taiwan under Grant NSC 100-2221-E-006-046. The review of this letter was arranged by Editor P. K.-L. Yu.",

year = "2011",

month = oct,

doi = "10.1109/LED.2011.2162391",

language = "English",

volume = "32",

pages = "1403--1405",

journal = "IEEE Electron Device Letters",

issn = "0741-3106",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "10",

}

TY - JOUR

T1 - Reducing OLED degradation using self-compensated circuit for AMOLED displays

AU - Lin, Chih Lung

AU - Chou, Kuan Wen

AU - Hung, Chia Che

AU - Chang, Yu Cheng

AU - Liao, Kuo Chao

N1 - Funding Information: Manuscript received June 16, 2011; accepted June 29, 2011. Date of publication August 29, 2011; date of current version September 28, 2011. This work was supported in part by the Advanced Optoelectronic Technology Center, National Cheng Kung University, under projects of the Ministry of Education and in part by the National Science Council of Taiwan under Grant NSC 100-2221-E-006-046. The review of this letter was arranged by Editor P. K.-L. Yu.

PY - 2011/10

Y1 - 2011/10

N2 - In this letter, the electric characteristics of the fabricated organic light-emitting diode (OLED) devices are analyzed after a bias stress. Experimental results demonstrate that when a constant voltage is applied to the OLED device, the OLED threshold voltage gradually increases, resulting in the driving current to decay. Therefore, a novel voltage driving scheme for active-matrix OLEDs using low-temperature polysilicon thin-film transistors (poly-Si TFTs) is proposed. This circuit uses three TFTs to increase the aperture ratio of panels and the driving current of the OLED device to ameliorate the luminance drop that is caused by OLED degradation. Simulation results indicate that the proposed pixel circuit has high immunity to V TH variations of the poly-Si TFTs and provides an extra compensation current against OLED degradation.

AB - In this letter, the electric characteristics of the fabricated organic light-emitting diode (OLED) devices are analyzed after a bias stress. Experimental results demonstrate that when a constant voltage is applied to the OLED device, the OLED threshold voltage gradually increases, resulting in the driving current to decay. Therefore, a novel voltage driving scheme for active-matrix OLEDs using low-temperature polysilicon thin-film transistors (poly-Si TFTs) is proposed. This circuit uses three TFTs to increase the aperture ratio of panels and the driving current of the OLED device to ameliorate the luminance drop that is caused by OLED degradation. Simulation results indicate that the proposed pixel circuit has high immunity to V TH variations of the poly-Si TFTs and provides an extra compensation current against OLED degradation.

UR - http://www.scopus.com/inward/record.url?scp=80053569580&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80053569580&partnerID=8YFLogxK

U2 - 10.1109/LED.2011.2162391

DO - 10.1109/LED.2011.2162391

M3 - Article

AN - SCOPUS:80053569580

SN - 0741-3106

VL - 32

SP - 1403

EP - 1405

JO - IEEE Electron Device Letters

JF - IEEE Electron Device Letters

IS - 10

M1 - 6004806

ER -

Reducing OLED degradation using self-compensated circuit for AMOLED displays

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